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Singapore, SG
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for detecting topographical features of microe...
Patent number
7,213,447
Issue date
May 8, 2007
Micron Technology, Inc.
Chee Peng Neo
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting topographical features of microe...
Patent number
6,923,045
Issue date
Aug 2, 2005
Micron Technology, Inc.
Chee Peng Neo
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting topographical features of microe...
Patent number
6,779,386
Issue date
Aug 24, 2004
Micron Technology Inc.
Chee Peng Neo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method and apparatus for detecting topographical features of microe...
Publication number
20050229684
Publication date
Oct 20, 2005
Micron Technology, Inc.
Chee Peng Neo
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for detecting topographical features of microe...
Publication number
20040253748
Publication date
Dec 16, 2004
Chee Peng Neo
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for detecting topographical features of microe...
Publication number
20030041656
Publication date
Mar 6, 2003
Chee Peng Neo
G01 - MEASURING TESTING