Kifah M. Muraweh

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System to calibrate on-die temperature sensor
- Patent number 7,695,189
- Issue date Apr 13, 2010
- Intel Corporation
- Chee H. Lim
- G01 - MEASURING TESTING
Information Patent Grant
System to calibrate on-die temperature sensor
- Patent number 7,417,448
- Issue date Aug 26, 2008
- Intel Corporation
- Chee H. Lim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM TO CALIBRATE ON-DIE TEMPERATURE SENSOR
- Publication number 20080304546
- Publication date Dec 11, 2008
- Chee H. Lim
- G01 - MEASURING TESTING
Information Patent Application
System to calibrate on-die temperature sensor
- Publication number 20080001615
- Publication date Jan 3, 2008
- Chee H. Lim
- G01 - MEASURING TESTING