Kiho YANG

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor devices including contacts and conductive line interf...
- Patent number 11,502,033
- Issue date Nov 15, 2022
- Samsung Electronics Co., Ltd.
- Kiho Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices including contacts and conductive line interf...
- Patent number 10,937,732
- Issue date Mar 2, 2021
- Samsung Electronics Co., Ltd.
- Kiho Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting pattern and an apparatus for manufacturing a...
- Patent number 9,965,851
- Issue date May 8, 2018
- Samsung Electronics Co., Ltd.
- Kaiyuan Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern analysis method of a semiconductor device
- Patent number 9,672,611
- Issue date Jun 6, 2017
- Samsung Electronics Co., Ltd.
- Kiho Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of inspecting a semiconductor device and semiconductor insp...
- Patent number 9,476,840
- Issue date Oct 25, 2016
- Samsung Electronics Co., Ltd.
- Kiho Yang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PROXIMITY CORRECTION METHOD, MASK MANUFACTURING METHOD, SEM...
- Publication number 20230205092
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Arin LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING CONTACTS AND CONDUCTIVE LINE INTERF...
- Publication number 20210167010
- Publication date Jun 3, 2021
- Samsung Electronics Co., Ltd.
- Kiho YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING CONTACTS AND CONDUCTIVE LINE INTERF...
- Publication number 20200083162
- Publication date Mar 12, 2020
- Samsung Electronics Co., Ltd.
- Kiho YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING PATTERN AND AN APPARATUS FOR MANUFACTURING A...
- Publication number 20160275663
- Publication date Sep 22, 2016
- Samsung Electronics Co., Ltd.
- Kaiyuan Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN ANALYSIS METHOD OF A SEMICONDUCTOR DEVICE
- Publication number 20160071261
- Publication date Mar 10, 2016
- Samsung Electronics Co., Ltd.
- KIHO YANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF INSPECTING A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR INSP...
- Publication number 20150110383
- Publication date Apr 23, 2015
- Samsung Electronics Co., Ltd.
- Kiho YANG
- G06 - COMPUTING CALCULATING COUNTING