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Kim Gerard FEIJEN
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Overpelt, BE
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last 30 patents
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Patent Grant
Inspection apparatus for measuring properties of a target structure...
Patent number
10,101,677
Issue date
Oct 16, 2018
ASML Netherlands B.V.
Kim Gerard Feijen
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Inspection Apparatus for Measuring Properties of a Target Structure...
Publication number
20160291479
Publication date
Oct 6, 2016
ASML NETHERLANDS B.V.
Kim Gerard FEIJEN
G02 - OPTICS