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Kim Wesley Atherton
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King County, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Supplementary metrology position coordinates determination system i...
Patent number
11,745,354
Issue date
Sep 5, 2023
Mitutoyo Corporation
Kim Atherton
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Power transfer configuration for supplying power to a detachable pr...
Patent number
10,914,581
Issue date
Feb 9, 2021
Mitutoyo Corporation
Kim Atherton
G01 - MEASURING TESTING
Information
Patent Grant
Variable focal length lens system with focus monitoring and control
Patent number
10,151,962
Issue date
Dec 11, 2018
Mitutoyo Corporation
Paul Gerard Gladnick
G02 - OPTICS
Information
Patent Grant
Calibration control device for metrology tools
Patent number
9,631,913
Issue date
Apr 25, 2017
Mitutoyo Corporation
Bruno Lefebvre
G01 - MEASURING TESTING
Information
Patent Grant
Remote accessory for generating customized and synchronized referen...
Patent number
9,606,525
Issue date
Mar 28, 2017
Mitutoyo Corporation
Kim Atherton
G05 - CONTROLLING REGULATING
Information
Patent Grant
Ergonomic micrometer including two modes of adjustment
Patent number
9,482,509
Issue date
Nov 1, 2016
Mitutoyo Corporation
Kim W. Atherton
G01 - MEASURING TESTING
Information
Patent Grant
Handheld measurement tool with user defined display
Patent number
8,978,263
Issue date
Mar 17, 2015
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Displacement sensor using multiple position sensitive photodetectors
Patent number
8,400,643
Issue date
Mar 19, 2013
Mitutoyo Corporation
Kim Atherton
G01 - MEASURING TESTING
Information
Patent Grant
On-site calibration method and object for chromatic point sensors
Patent number
7,873,488
Issue date
Jan 18, 2011
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic caliper with reference scale on edge
Patent number
7,530,177
Issue date
May 12, 2009
Mitutoyo Corporation
Michael E. Meichle
G01 - MEASURING TESTING
Information
Patent Grant
Handheld metrology imaging system and method
Patent number
7,333,219
Issue date
Feb 19, 2008
Mitutoyo Corporation
Dahai Yu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Precision measuring gauges with optical fiber output channels
Patent number
7,211,782
Issue date
May 1, 2007
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring wavelength changes in a high-res...
Patent number
7,088,441
Issue date
Aug 8, 2006
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Absolute position miniature grating encoder readhead using fiber op...
Patent number
7,053,362
Issue date
May 30, 2006
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for rapidly automatically focusing a machine vi...
Patent number
7,030,351
Issue date
Apr 18, 2006
Mitutoyo Corporation
Richard M. Wasserman
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Miniature imaging encoder readhead using fiber optic receiver channels
Patent number
6,905,258
Issue date
Jun 14, 2005
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Scale structures and methods usable in an absolute position transducer
Patent number
6,867,412
Issue date
Mar 15, 2005
Mitutoyo Corporation
Andrew M. Patzwald
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer using integrated imaging array and high-density pola...
Patent number
6,850,329
Issue date
Feb 1, 2005
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer using integrated imaging array and high-density phas...
Patent number
6,847,457
Issue date
Jan 25, 2005
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional scale structures and method usable in an absolute p...
Patent number
6,781,694
Issue date
Aug 24, 2004
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Optical displacement sensing device with reduced sensitivity to mis...
Patent number
6,771,377
Issue date
Aug 3, 2004
Mitutoyo Corporation
Benjamin K. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Induced current absolute position transducer method using a code-tr...
Patent number
6,054,851
Issue date
Apr 25, 2000
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Induced current position transducer having a low power electronic c...
Patent number
6,011,389
Issue date
Jan 4, 2000
Mitutoyo Corporation
Karl Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Electronic linear scale using a self-contained, low-power inductive...
Patent number
6,002,250
Issue date
Dec 14, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Electronic caliper using a self-contained, low power inductive posi...
Patent number
5,973,494
Issue date
Oct 26, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Electronic linear tape measure using a low power induced current po...
Patent number
5,894,678
Issue date
Apr 20, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Multi-scale induced current absolute position transducer
Patent number
5,886,519
Issue date
Mar 23, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Induced current absolute position transducer using a code-track-typ...
Patent number
5,841,274
Issue date
Nov 24, 1998
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Sealed mechanical configuration for electronic calipers for reliabl...
Patent number
5,574,381
Issue date
Nov 12, 1996
Mitutoyo Corporation
Nils I. Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Precision linear measuring suspension system having sliding contact...
Patent number
5,172,485
Issue date
Dec 22, 1992
Mitutoyo Corporation
Gregory J. Gerhard
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SUPPLEMENTARY METROLOGY POSITION COORDINATES DETERMINATION SYSTEM I...
Publication number
20210162601
Publication date
Jun 3, 2021
MITUTOYO CORPORATION
Kim Atherton
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
POWER TRANSFER CONFIGURATION FOR SUPPLYING POWER TO A DETACHABLE PR...
Publication number
20190145764
Publication date
May 16, 2019
MITUTOYO CORPORATION
Kim Atherton
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE FOCAL LENGTH LENS SYSTEM WITH FOCUS MONITORING AND CONTROL
Publication number
20180088440
Publication date
Mar 29, 2018
MITUTOYO CORPORATION
Paul Gerard Gladnick
G02 - OPTICS
Information
Patent Application
ERGONOMIC MICROMETER INCLUDING TWO MODES OF ADJUSTMENT
Publication number
20160169653
Publication date
Jun 16, 2016
Mitutoyo Corporation
Kim W. Atherton
G01 - MEASURING TESTING
Information
Patent Application
REMOTE ACCESSORY FOR GENERATING CUSTOMIZED AND SYNCHRONIZED REFEREN...
Publication number
20150177729
Publication date
Jun 25, 2015
MITUTOYO CORPORATION
Kim Atherton
G05 - CONTROLLING REGULATING
Information
Patent Application
Calibration Control Device for Metrology Tools
Publication number
20150059431
Publication date
Mar 5, 2015
Mitutoyo Corporation
Bruno Lefebvre
G01 - MEASURING TESTING
Information
Patent Application
HANDHELD MEASUREMENT TOOL WITH USER DEFINED DISPLAY
Publication number
20140033554
Publication date
Feb 6, 2014
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT SENSOR USING MULTIPLE POSITION SENSITIVE PHOTODETECTORS
Publication number
20120262733
Publication date
Oct 18, 2012
Mitutoyo Corporation
Kim Atherton
G01 - MEASURING TESTING
Information
Patent Application
ON-SITE CALIBRATION METHOD AND OBJECT FOR CHROMATIC POINT SENSORS
Publication number
20100145650
Publication date
Jun 10, 2010
MITUTOYO CORPORATION
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC CALIPER WITH REFERENCE SCALE ON EDGE
Publication number
20090119940
Publication date
May 14, 2009
Mitutoyo Corporation
Michael E. Meichle
G01 - MEASURING TESTING
Information
Patent Application
Handheld metrology imaging system and method
Publication number
20060221351
Publication date
Oct 5, 2006
Dahai Yu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Precision measuring gauges with optical fiber output channels
Publication number
20050224705
Publication date
Oct 13, 2005
Joseph D. Tobiason
G02 - OPTICS
Information
Patent Application
Systems and methods for rapidly automatically focusing a machine vi...
Publication number
20050109959
Publication date
May 26, 2005
Mitutoyo Corporation
Richard M. Wasserman
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
MINIATURE IMAGING ENCODER READHEAD USING FIBER OPTIC RECEIVER CHANNELS
Publication number
20050047728
Publication date
Mar 3, 2005
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Application
Absolute position miniature grating encoder readhead using fiber op...
Publication number
20040217268
Publication date
Nov 4, 2004
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Application
Scale structures and methods usable in an absolute position transducer
Publication number
20040089796
Publication date
May 13, 2004
Mitutoyo Corporation
Andrew M. Patzwald
G01 - MEASURING TESTING
Information
Patent Application
Interferometer using integrated imaging array and high-density phas...
Publication number
20040080754
Publication date
Apr 29, 2004
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Application
Interferometer using integrated imaging array and high-density pola...
Publication number
20040070767
Publication date
Apr 15, 2004
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring wavelength changes in a high-res...
Publication number
20040057041
Publication date
Mar 25, 2004
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL SCALE STRUCTURES AND METHOD USABLE IN AN ABSOLUTE P...
Publication number
20040012794
Publication date
Jan 22, 2004
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Application
Optical displacement sensing device with reduced sensitivity to mis...
Publication number
20030174343
Publication date
Sep 18, 2003
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Application
Optical displacement sensing device with reduced sensitivity to mis...
Publication number
20030174344
Publication date
Sep 18, 2003
Mitutoyo Corporation
Benjamin K. Jones
G01 - MEASURING TESTING