TREA

Kimberly R. Gleason

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  • Portland, OR, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Coaxial wafer probe with tip shielding
    • Patent number 5,565,788
    • Issue date Oct 15, 1996
    • Cascade Microtech, Inc.
    • Jeremy Burr
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probes
    • Patent number 4,853,627
    • Issue date Aug 1, 1989
    • TriQuint Semiconductor, Inc.
    • Kimberly R. Gleason
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probe
    • Patent number 4,827,211
    • Issue date May 2, 1989
    • Cascade Microtech, Inc.
    • Eric W. Strid
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probe
    • Patent number 4,697,143
    • Issue date Sep 29, 1987
    • Cascade Microtech, Inc.
    • Larry R. Lockwood
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Self-aligned recessed gate process
    • Patent number 4,656,076
    • Issue date Apr 7, 1987
    • Triquint Semiconductors, Inc.
    • William A. Vetanen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Source-side self-aligned gate process
    • Patent number 4,642,259
    • Issue date Feb 10, 1987
    • Triquint Semiconductors, Inc.
    • William A. Vetanen
    • H01 - BASIC ELECTRIC ELEMENTS