Kimiaki Ando

Person

Hamura, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspecting apparatus and inspecting method
- Patent number 8,937,714
- Issue date Jan 20, 2015
- Hitachi High-Technologies Corporation
- Kimiaki Ando
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus and method of generating an electron beam i...
- Patent number 8,008,622
- Issue date Aug 30, 2011
- Hitachi High-Technologies Corporation
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,952,074
- Issue date May 31, 2011
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus and method of generating an electron beam i...
- Patent number 7,635,851
- Issue date Dec 22, 2009
- Hitachi High-Technologies Corporation
- Ryo Fujita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam drawing apparatus
- Patent number 7,608,844
- Issue date Oct 27, 2009
- Hitachi High-Technologies Corporation
- Yuji Inoue
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,417,444
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,026,830
- Issue date Apr 11, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,559,663
- Issue date May 6, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam exposure method and apparatus and semiconductor devic...
- Patent number 6,403,973
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Hiroyuki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contactless IC card
- Patent number 6,373,708
- Issue date Apr 16, 2002
- Hitachi, Ltd.
- Kimiaki Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,329,826
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,172,363
- Issue date Jan 9, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Contactless IC card
- Patent number 5,999,409
- Issue date Dec 7, 1999
- Hitachi, Ltd.
- Kimiaki Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell signal processing circuit and optical switch apparatus using t...
- Patent number 5,197,097
- Issue date Mar 23, 1993
- Hitachi, Ltd.
- Yasushi Takahashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron beam lithography system
- Patent number 4,943,729
- Issue date Jul 24, 1990
- Hitachi, Ltd.
- Kimiaki Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography apparatus
- Patent number 4,820,928
- Issue date Apr 11, 1989
- Hitachi, Ltd.
- Mitsuo Ooyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for processing floating-point data having exponents of a...
- Patent number 4,758,973
- Issue date Jul 19, 1988
- Hitachi, Ltd.
- Mitsuo Ooyama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Graphic display apparatus with a vector generating circuit
- Patent number 4,580,236
- Issue date Apr 1, 1986
- Hitachi, Ltd.
- Shigeo Tsujioka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTING APPARATUS AND INSPECTING METHOD
- Publication number 20120314211
- Publication date Dec 13, 2012
- Hitachi High-Technologies Corporation
- Kimiaki Ando
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Apparatus And Method Of Generating An Electron Beam I...
- Publication number 20100078555
- Publication date Apr 1, 2010
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron Beam Apparatus And Method of Generating An Electron Beam I...
- Publication number 20100078556
- Publication date Apr 1, 2010
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN
- Publication number 20080302964
- Publication date Dec 11, 2008
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Electron beam apparatus and method of generating an electron beam i...
- Publication number 20070057200
- Publication date Mar 15, 2007
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20060043982
- Publication date Mar 2, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Electron-beam drawing apparatus and electron-beam drawing method
- Publication number 20060033050
- Publication date Feb 16, 2006
- Kimiaki Ando
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged particle beam drawing apparatus
- Publication number 20050285054
- Publication date Dec 29, 2005
- Yuji Inoue
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron-beam drawing apparatus and electron-beam drawing method
- Publication number 20040178366
- Publication date Sep 16, 2004
- Hitachi, Ltd
- Kimiaki Ando
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20030169060
- Publication date Sep 11, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20020027440
- Publication date Mar 7, 2002
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Electron-beam drawing appraratus electron-beam drawing method
- Publication number 20020024020
- Publication date Feb 28, 2002
- Kimiaki Ando
- B82 - NANO-TECHNOLOGY

Kimiaki Ando

Person

Patents Grantslast 30 patents

Inspecting apparatus and inspecting method

Electron beam apparatus and method of generating an electron beam i...

Method and apparatus for inspecting integrated circuit pattern

Electron beam apparatus and method of generating an electron beam i...

Charged particle beam drawing apparatus

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Electron beam exposure method and apparatus and semiconductor devic...

Contactless IC card

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Contactless IC card

Cell signal processing circuit and optical switch apparatus using t...

Electron beam lithography system

Lithography apparatus

Apparatus for processing floating-point data having exponents of a...

Graphic display apparatus with a vector generating circuit

Patents Applicationslast 30 patents

INSPECTING APPARATUS AND INSPECTING METHOD

Electron Beam Apparatus And Method Of Generating An Electron Beam I...

Electron Beam Apparatus And Method of Generating An Electron Beam I...

METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN

Electron beam apparatus and method of generating an electron beam i...

Method and apparatus for inspecting integrated circuit pattern

Electron-beam drawing apparatus and electron-beam drawing method

Charged particle beam drawing apparatus

Electron-beam drawing apparatus and electron-beam drawing method

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Electron-beam drawing appraratus electron-beam drawing method