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Kimihiko Arimoto

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  • Osaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor laser device and analysis apparatus
    • Patent number 11,949,210
    • Issue date Apr 2, 2024
    • Horiba, Ltd.
    • Makoto Matsuhama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Biological sample analysis device
    • Patent number 11,280,741
    • Issue date Mar 22, 2022
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Kazuya Nakagawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Reference electrode
    • Patent number 10,914,707
    • Issue date Feb 9, 2021
    • Horiba, Ltd.
    • Kazuhiro Miyamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Absorption spectrometer
    • Patent number 9,897,485
    • Issue date Feb 20, 2018
    • HORIBA, LTD.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Analyzing device
    • Patent number 9,176,046
    • Issue date Nov 3, 2015
    • HORIBA, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical analyzer
    • Patent number 9,007,591
    • Issue date Apr 14, 2015
    • HORIBA, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical measurement device
    • Patent number 8,699,031
    • Issue date Apr 15, 2014
    • HORIBA, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample cell for fluorescent X-ray analysis and sample cell assembly...
    • Patent number 8,550,710
    • Issue date Oct 8, 2013
    • Horiba, Ltd.
    • Mayuko Kishida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical measurement cell
    • Patent number 8,390,812
    • Issue date Mar 5, 2013
    • HORIBA, Ltd.
    • Issei Yokoyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Analyzer
    • Patent number 8,305,574
    • Issue date Nov 6, 2012
    • Horiba, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Substrate inspection apparatus and method
    • Patent number 7,327,444
    • Issue date Feb 5, 2008
    • Horiba, Ltd.
    • Nobuyuki Naka
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE AND WATER QUALITY ANALYSIS SYSTEM
    • Publication number 20230288332
    • Publication date Sep 14, 2023
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Issei KOBAYASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR LASER DEVICE AND ANALYSIS APPARATUS
    • Publication number 20200287349
    • Publication date Sep 10, 2020
    • Horiba, Ltd.
    • Makoto MATSUHAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    BIOLOGICAL SAMPLE ANALYSIS DEVICE
    • Publication number 20200110033
    • Publication date Apr 9, 2020
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Kazuya Nakagawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    GAS CONCENTRATION MEASUREMENT APPARATUS
    • Publication number 20180003626
    • Publication date Jan 4, 2018
    • HORIBA, Ltd.
    • Kimihiko ARIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    REFERENCE ELECTRODE
    • Publication number 20170191960
    • Publication date Jul 6, 2017
    • HORIBA, LTD.
    • Kazuhiro Miyamura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ABSORPTION SPECTROMETER
    • Publication number 20170167918
    • Publication date Jun 15, 2017
    • HORIBA, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYZING DEVICE
    • Publication number 20140300894
    • Publication date Oct 9, 2014
    • HORIBA, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ANALYZER
    • Publication number 20140146317
    • Publication date May 29, 2014
    • HORIBA, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    Concentration Measuring Device used in Manufacturing Process
    • Publication number 20130273670
    • Publication date Oct 17, 2013
    • HORIBA, Ltd.
    • Kimihiko ARIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE
    • Publication number 20110317166
    • Publication date Dec 29, 2011
    • HORIBA, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT CELL
    • Publication number 20110299067
    • Publication date Dec 8, 2011
    • HORIBA, Ltd.
    • Issei Yokoyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE CELL FOR FLUORESCENT X-RAY ANALYSIS AND SAMPLE CELL ASSEMBLY...
    • Publication number 20110085638
    • Publication date Apr 14, 2011
    • Mayuko Kishida
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYZER
    • Publication number 20110043792
    • Publication date Feb 24, 2011
    • Horiba, Ltd.
    • Kimihiko ARIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    VIBRATION ISOLATION SYSTEM
    • Publication number 20090050779
    • Publication date Feb 26, 2009
    • Horiba, Ltd.
    • Kimihiko Arimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Substrate inspection apparatus and method
    • Publication number 20060038980
    • Publication date Feb 23, 2006
    • Nobuyuki Naka
    • G01 - MEASURING TESTING