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Kimihisa Yamamoto
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Three dimensional analyzing device
Patent number
7,304,315
Issue date
Dec 4, 2007
Japan Science and Technology Agency
Yoshinori Iketaki
G01 - MEASURING TESTING
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Patent Grant
Super resolution microscope
Patent number
6,859,313
Issue date
Feb 22, 2005
Japan Science and Technology Corporation
Yoshinori Iketaki
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
Three dimensional analyzing device
Publication number
20060290924
Publication date
Dec 28, 2006
Japan Science and Technology Agency
Yoshinori Iketaki
G01 - MEASURING TESTING
Information
Patent Application
Microscope
Publication number
20020167724
Publication date
Nov 14, 2002
JAPAN SCIENCE AND TECHNOLOGY CORPORATION
Yoshinori Iketaki
G02 - OPTICS