Kiminori YOSHINO

Person

Kuwana, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Modeling method
- Patent number 12,124,786
- Issue date Oct 22, 2024
- Kioxia Corporation
- Shimpei Miura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor defect inspection apparatus and semiconductor defect...
- Patent number 11,119,059
- Issue date Sep 14, 2021
- TOSHIBA MEMORY CORPORATION
- Kiminori Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Imprinting system, method of manufacturing semiconductor device, an...
- Patent number 10,915,018
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahito Nishimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor defect inspection apparatus
- Patent number 10,890,539
- Issue date Jan 12, 2021
- Kioxia Corporation
- Hiroaki Shirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus for measuring height or shape of a surface of...
- Patent number 10,845,190
- Issue date Nov 24, 2020
- TOSHIBA MEMORY CORPORATION
- Kiminori Yoshino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20240231244
- Publication date Jul 11, 2024
- KIOXIA Corporation
- Hiroyuki TANIZAKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVE...
- Publication number 20240061014
- Publication date Feb 22, 2024
- KIOXIA Corporation
- Kiminori YOSHINO
- G01 - MEASURING TESTING
Information Patent Application
MODELING METHOD
- Publication number 20220302102
- Publication date Sep 22, 2022
- KIOXIA Corporation
- Shimpei MIURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEFECT INSPECTION APPARATUS
- Publication number 20200408700
- Publication date Dec 31, 2020
- KIOXIA Corporation
- Hiroaki SHIRAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEFECT INSPECTION APPARATUS AND SEMICONDUCTOR DEFECT...
- Publication number 20200271600
- Publication date Aug 27, 2020
- Toshiba Memory Corporation
- Kiminori YOSHINO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20190271541
- Publication date Sep 5, 2019
- Toshiba Memory Corporation
- Kiminori YOSHINO
- G01 - MEASURING TESTING
Information Patent Application
IMPRINTING SYSTEM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AN...
- Publication number 20190243236
- Publication date Aug 8, 2019
- Toshiba Memory Corporation
- Takahito NISHIMURA
- B82 - NANO-TECHNOLOGY

Kiminori YOSHINO

Person

Patents Grantslast 30 patents

Modeling method

Semiconductor defect inspection apparatus and semiconductor defect...

Imprinting system, method of manufacturing semiconductor device, an...

Semiconductor defect inspection apparatus

Measurement apparatus for measuring height or shape of a surface of...

Patents Applicationslast 30 patents

MEASURING DEVICE AND MEASURING METHOD

LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVE...

MODELING METHOD

SEMICONDUCTOR DEFECT INSPECTION APPARATUS

SEMICONDUCTOR DEFECT INSPECTION APPARATUS AND SEMICONDUCTOR DEFECT...

MEASUREMENT APPARATUS

IMPRINTING SYSTEM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AN...