Kiminori Yoshino

Follow

Person

Yokkaichi-Shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 9,176,074
- Issue date Nov 3, 2015
- Kabushiki Kaisha Toshiba
- Takayoshi Fujii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20160363541
- Publication date Dec 15, 2016
- KABUSHIKI KAISHA TOSHIBA
- Kiminori YOSHINO
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20140212023
- Publication date Jul 31, 2014
- KABUSHIKI KAISHA TOSHIBA
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20130063721
- Publication date Mar 14, 2013
- Kabushiki Kaisha Toshiba
- Takayoshi FUJII
- G01 - MEASURING TESTING