Kin Lam Tong

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Hsin-Chu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for diagnosing an integrated circuit
- Patent number 9,097,762
- Issue date Aug 4, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kin Lam Tong
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting soft-fails
- Patent number 8,339,155
- Issue date Dec 25, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nan-Hsin Tseng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Diagnosing an Integrated Circuit
- Publication number 20130305112
- Publication date Nov 14, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kin Lam Tong
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Detecting Soft-Fails
- Publication number 20110121856
- Publication date May 26, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nan-Hsin Tseng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and Apparatus for Diagnosing an Integrated Circuit
- Publication number 20100244853
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kin Lam Tong
- G01 - MEASURING TESTING