King-Hung Lee

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Heterodyne interferometry method for measuring physical parameters...
- Patent number 5,946,096
- Issue date Aug 31, 1999
- Industrial Technology Research Institute
- King-Hung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Optical vacuum pressure gauge
- Patent number 5,908,988
- Issue date Jun 1, 1999
- Industrial Technology Research Institute
- King-Hung Lee
- G01 - MEASURING TESTING