Kip Stevenson

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe tip formation for die sort and test
- Patent number 9,823,273
- Issue date Nov 21, 2017
- Intel Corporation
- Keith J. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Composite wire probe test assembly
- Patent number 9,354,273
- Issue date May 31, 2016
- Intel Corporation
- Kip Stevenson
- G01 - MEASURING TESTING
Information Patent Grant
Composite wire probes for testing integrated circuits
- Patent number 9,207,258
- Issue date Dec 8, 2015
- Intel Corporation
- David Shia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITE WIRE PROBE TEST ASSEMBLY
- Publication number 20160274148
- Publication date Sep 22, 2016
- Intel Corporation
- Kip Stevenson
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP FORMATION FOR DIE SORT AND TEST
- Publication number 20150002181
- Publication date Jan 1, 2015
- Keith J. Martin
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY AND METHODS FOR DETECTION OF LIQUID
- Publication number 20140224990
- Publication date Aug 14, 2014
- Kip P. Stevenson
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE WIRE PROBE TEST ASSEMBLY
- Publication number 20140176172
- Publication date Jun 26, 2014
- Kip Stevenson
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE WIRE PROBES FOR TESTING INTEGRATED CIRCUITS
- Publication number 20140091821
- Publication date Apr 3, 2014
- David Shia
- G01 - MEASURING TESTING