Kiran Jitendra

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for electrical inspection of flat panel display...
- Patent number 10,962,567
- Issue date Mar 30, 2021
- Photon Dynamics, Inc.
- Gordon Yue
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe configuration station and method therefor
- Patent number 9,103,876
- Issue date Aug 11, 2015
- Photon Dynamics, Inc.
- Kent Nguyen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING
- Publication number 20240112935
- Publication date Apr 4, 2024
- Photon Dynamics, Inc.
- Neil Dang Nguyen
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING
- Publication number 20220208579
- Publication date Jun 30, 2022
- Photon Dynamics, Inc.
- Neil Dang Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ELECTRICAL INSPECTION OF FLAT PANEL DISPLAY...
- Publication number 20170146567
- Publication date May 25, 2017
- Photon Dynamics, Inc.
- Gordon Yue
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC PROBE CONFIGURATION STATION AND METHOD THEREFOR
- Publication number 20120319713
- Publication date Dec 20, 2012
- Photon Dynamics, Inc.
- Kent Nguyen
- G01 - MEASURING TESTING