Kirill SAVCHENKO

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Lod, IL

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Patents Grantslast 30 patents

Information Patent Grant
Machine learning-based classification of defects in a semiconductor...
- Patent number 12,361,531
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a semiconductor specimen and syste...
- Patent number 11,151,706
- Issue date Oct 19, 2021
- APPLIED MATERIAL ISRAEL, LTD.
- Kirill Savchenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a semiconductor specimen and syste...
- Patent number 11,037,286
- Issue date Jun 15, 2021
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for classifying defects
- Patent number 10,921,334
- Issue date Feb 16, 2021
- Applied Materials Israel Ltd.
- Kirill Savchenko
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING-BASED CLASSIFICATION OF DEFECTS IN A SEMICONDUCTOR...
- Publication number 20220222806
- Publication date Jul 14, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...
- Publication number 20200226743
- Publication date Jul 16, 2020
- Kirill SAVCHENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING DEFECTS
- Publication number 20190293669
- Publication date Sep 26, 2019
- Applied Materials Israel Ltd.
- Kirill SAVCHENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...
- Publication number 20190096053
- Publication date Mar 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING