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Kirk C. Odencrantz
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Reno, NV, US
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last 30 patents
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Patent Grant
Resampling system using data interpolation to eliminate time effects
Patent number
5,043,928
Issue date
Aug 27, 1991
Linear Instruments
Kirk C. Odencrantz
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Event Detection For Back-Scattering Interferometry
Publication number
20150057949
Publication date
Feb 26, 2015
Molecular Sensing, Inc.
Scot R. Weinberger
G01 - MEASURING TESTING
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Patent Application
Methods and systems for interferometric analysis
Publication number
20100188665
Publication date
Jul 29, 2010
Molecular Sensing, Inc.
Stephen Dotson
G01 - MEASURING TESTING