Kirk Rolofson

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Gresham, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-layer registration and dimensional test mark for scatterometr...
- Patent number 7,492,049
- Issue date Feb 17, 2009
- LSI Corporation
- Phong Thanh Do
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer registration and dimensional test mark for scatterometr...
- Patent number 7,258,953
- Issue date Aug 21, 2007
- LSI Corporation
- Phong Thanh Do
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTI-LAYER REGISTRATION AND DIMENSIONAL TEST MARK FOR SCATTEROMETR...
- Publication number 20070246844
- Publication date Oct 25, 2007
- Phong Thanh Do
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for improving integrated circuit manufacturing yield
- Publication number 20060258023
- Publication date Nov 16, 2006
- LSI Logic Corporation
- Kirk Rolofson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate edge focus compensation
- Publication number 20060194129
- Publication date Aug 31, 2006
- Douglas M. Horn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Multi-layer registration and dimensional test mark for scatterometr...
- Publication number 20060172447
- Publication date Aug 3, 2006
- LSI Logic Corporation
- Phong Thanh Do
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY