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Kirsten S. Lunzer
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Arden Hills, MN, US
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Patents Grants
last 30 patents
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Patent Grant
Programmable on-chip logic analyzer apparatus, systems, and methods
Patent number
8,575,958
Issue date
Nov 5, 2013
Micron Technology, Inc.
Kirsten S. Lunzer
G01 - MEASURING TESTING
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Patent Grant
Programmable on-chip logic analyzer apparatus, systems, and methods
Patent number
7,944,234
Issue date
May 17, 2011
Micron Technology, Inc.
Kirsten S. Lunzer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROGRAMMABLE ON-CHIP LOGIC ANALYZER APPARATUS, SYSTEMS, AND METHODS
Publication number
20110215833
Publication date
Sep 8, 2011
Kirsten S. Lunzer
G01 - MEASURING TESTING
Information
Patent Application
PROGRAMMABLE ON-CHIP LOGIC ANALYZER APPARATUS, SYSTEMS, AND METHODS
Publication number
20090237110
Publication date
Sep 24, 2009
Micron Technology, Inc.
Kirsten S. Lunzer
G01 - MEASURING TESTING