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Kishio Hidaka
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Hitachiohta-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning probe microscope and sample observing method using the same
Patent number
8,695,110
Issue date
Apr 8, 2014
Hitachi, Ltd.
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope and method of observing sample using the...
Patent number
8,635,710
Issue date
Jan 21, 2014
Hitachi, Ltd.
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope and method of observing sample using the...
Patent number
8,407,811
Issue date
Mar 26, 2013
Hitachi, Ltd.
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope and sample observing method using the same
Patent number
8,272,068
Issue date
Sep 18, 2012
Hitachi, Ltd.
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope and method of observing sample using the...
Patent number
8,181,268
Issue date
May 15, 2012
Hitachi, Ltd.
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Field emission type electron gun comprising single fibrous carbon e...
Patent number
7,777,404
Issue date
Aug 17, 2010
Hitachi High-Technologies Corporation
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field emission electron gun and electron beam applied device using...
Patent number
7,732,764
Issue date
Jun 8, 2010
Hitachi, Ltd.
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Conductive probe and method for producing the same
Patent number
7,710,012
Issue date
May 4, 2010
Hitachi High-Technologies Corporation
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe manufacturing method, probe, and scanning probe microscope
Patent number
7,388,199
Issue date
Jun 17, 2008
Hitachi Kenki Fine Tech Co., Ltd.
Takafumi Morimoto
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave absorption material and an associated device
Patent number
7,239,261
Issue date
Jul 3, 2007
Hitachi Ltd.
Tadashi Fujieda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Field emission gun and electron beam instruments
Patent number
7,151,268
Issue date
Dec 19, 2006
Hitachi High-Technologies Corporation
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Covalently bonded catalyst carrier and catalytic component
Patent number
7,108,939
Issue date
Sep 19, 2006
Hitachi, Ltd.
Shuichi Suzuki
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Magnetic carbon nanotube
Patent number
7,109,703
Issue date
Sep 19, 2006
Hitachi, Ltd.
Shuichi Suzuki
G11 - INFORMATION STORAGE
Information
Patent Grant
Catalytic material, electrode, and fuel cell using the same
Patent number
7,105,246
Issue date
Sep 12, 2006
Hiatchi Ltd.
Shuichi Suzuki
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Carbon nanotube connected instrument
Patent number
6,991,932
Issue date
Jan 31, 2006
Hitachi, Ltd.
Kishio Hidaka
G01 - MEASURING TESTING
Information
Patent Grant
Emission source having carbon nanotube, electron microscope using t...
Patent number
6,930,313
Issue date
Aug 16, 2005
Hitachi, Ltd.
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic carbon nanotube
Patent number
6,878,444
Issue date
Apr 12, 2005
Hitachi, Ltd.
Shuichi Suzuki
G11 - INFORMATION STORAGE
Information
Patent Grant
Electron microscope
Patent number
6,833,550
Issue date
Dec 21, 2004
Hitachi, Ltd.
Mitsuo Hayashibara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electromagnetic wave absorption material and an associated device
Patent number
6,818,821
Issue date
Nov 16, 2004
Hitachi, Ltd.
Tadashi Fujieda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for fabricating electrode device
Patent number
6,734,087
Issue date
May 11, 2004
Hitachi, Ltd.
Kishio Hidaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas turbine for power generation
Patent number
6,574,966
Issue date
Jun 10, 2003
Hitachi, Ltd.
Kishio Hidaka
C21 - METALLURGY OF IRON
Information
Patent Grant
Gene sequence-reading instrument
Patent number
6,555,362
Issue date
Apr 29, 2003
Hitachi, Ltd.
Kishio Hidaka
G01 - MEASURING TESTING
Information
Patent Grant
Gas turbine for power generation, and combined power generation system
Patent number
6,546,713
Issue date
Apr 15, 2003
Hitachi, Ltd.
Kishio Hidaka
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Grant
Sample heating holder, method of observing a sample and charged par...
Patent number
6,495,838
Issue date
Dec 17, 2002
Hitachi, Ltd.
Toshie Yaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Steam-turbine power plant and steam turbine
Patent number
6,174,132
Issue date
Jan 16, 2001
Hitachi, Ltd.
Masao Shiga
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Steam-turbine power plant and steam turbine
Patent number
6,123,504
Issue date
Sep 26, 2000
Hitachi, Ltd.
Masao Shiga
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
High strength heat resisting cast steel, steam turbine casing, stea...
Patent number
5,961,284
Issue date
Oct 5, 1999
Hitachi, Ltd.
Mitsuo Kuriyama
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Grant
Heat resisting steel and steam turbine rotor shaft and method of ma...
Patent number
5,911,842
Issue date
Jun 15, 1999
Hitachi, Ltd.
Masao Shiga
C21 - METALLURGY OF IRON
Information
Patent Grant
Electron microscope
Patent number
5,898,177
Issue date
Apr 27, 1999
Hitachi, Ltd.
Kishio Hidaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Steam-turbine power plant and steam turbine
Patent number
5,749,228
Issue date
May 12, 1998
Hitachi, Ltd.
Masao Shiga
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME
Publication number
20130145507
Publication date
Jun 6, 2013
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Application
Scanning Probe Microscope and Method of Observing Sample Using the...
Publication number
20120204297
Publication date
Aug 9, 2012
HITACHI, LTD.
Toshihiko Nakata
G01 - MEASURING TESTING
Information
Patent Application
DISC BRAKE
Publication number
20110100773
Publication date
May 5, 2011
Hitachi Chemical Company, Ltd.
Kishio Hidaka
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
CARBON/SILICON CARBIDE SYSTEM COMPOSITE MATERIAL
Publication number
20100331166
Publication date
Dec 30, 2010
Hitachi Chemical Company, Ltd.
Kishio HIDAKA
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Application
Scanning Probe Microscope and Method of Observing Sample Using the...
Publication number
20100325761
Publication date
Dec 23, 2010
Hitachi, Ltd
Toshihiko Nakata
G01 - MEASURING TESTING
Information
Patent Application
Tip-sharpened carbon nanotubes and electron source using thereof
Publication number
20100258724
Publication date
Oct 14, 2010
Hitachi High-Technologies Corporation
Mitsuo Hayashibara
B82 - NANO-TECHNOLOGY
Information
Patent Application
SCANNING PROBE MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE...
Publication number
20100218287
Publication date
Aug 26, 2010
Toshihiko NAKATA
G01 - MEASURING TESTING
Information
Patent Application
FIELD EMISSION TYPE ELECTRON GUN COMPRISING SINGLE FIBROUS CARBON E...
Publication number
20100193687
Publication date
Aug 5, 2010
Hitachi High-Technologies Corporation
Tadashi Fujieda
B82 - NANO-TECHNOLOGY
Information
Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME
Publication number
20100064396
Publication date
Mar 11, 2010
Toshihiko Nakata
G01 - MEASURING TESTING
Information
Patent Application
Electron emitting element, electron gun, and electron beam applied...
Publication number
20080315747
Publication date
Dec 25, 2008
Hitachi High-Technologies Corporation
Makoto Okai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Field emission electron gun and method of operating the same
Publication number
20080169743
Publication date
Jul 17, 2008
Hitachi High-Technologies Corporation
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONDUCTIVE PROBE AND METHOD FOR PRODUCING THE SAME
Publication number
20080067407
Publication date
Mar 20, 2008
Tadashi Fujieda
B82 - NANO-TECHNOLOGY
Information
Patent Application
FIELD EMISSION ELECTRON GUN AND ELECTRON BEAM APPLIED DEVICE USING...
Publication number
20080029700
Publication date
Feb 7, 2008
TADASHI FUJIEDA
B82 - NANO-TECHNOLOGY
Information
Patent Application
Cantilever and inspecting apparatus
Publication number
20070051887
Publication date
Mar 8, 2007
Kishio Hidaka
G01 - MEASURING TESTING
Information
Patent Application
Probe manufacturing method, probe, and scanning probe microsope
Publication number
20060284084
Publication date
Dec 21, 2006
Takafumi Morimoto
G01 - MEASURING TESTING
Information
Patent Application
Field emission electron gun and electron beam apparatus using the same
Publication number
20060001350
Publication date
Jan 5, 2006
Hitachi High-Technologies Corporation
Tadashi Fujieda
B82 - NANO-TECHNOLOGY
Information
Patent Application
Field emission gun and electron beam instruments
Publication number
20050212440
Publication date
Sep 29, 2005
Hitachi High-Technologies Corporation
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Magnetic carbon nanotube
Publication number
20050151536
Publication date
Jul 14, 2005
Shuichi Suzuki
G01 - MEASURING TESTING
Information
Patent Application
Catalytic material, electrode, and fuel cell using the same
Publication number
20050142429
Publication date
Jun 30, 2005
Shuichi Suzuki
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Submicron size metal deposit apparatus
Publication number
20050072360
Publication date
Apr 7, 2005
Kishio Hidaka
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Electromagnetic wave absorption material and an associated device
Publication number
20050035896
Publication date
Feb 17, 2005
Tadashi Fujieda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Tube laminate and method for producing the same
Publication number
20040180157
Publication date
Sep 16, 2004
Takao Ishikawa
B32 - LAYERED PRODUCTS
Information
Patent Application
Method for fabricating electrode device
Publication number
20040157449
Publication date
Aug 12, 2004
Kishio Hidaka
B82 - NANO-TECHNOLOGY
Information
Patent Application
Electromagnetic wave absorption material and an associated device
Publication number
20040146452
Publication date
Jul 29, 2004
Tadashi Fujieda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Electron microscope
Publication number
20040144922
Publication date
Jul 29, 2004
Mitsuo Hayashibara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Catalytic material, electrode, and fuel cell using the same
Publication number
20040121221
Publication date
Jun 24, 2004
Shuichi Suzuki
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Emission source having carbon nanotube, electron microscope using t...
Publication number
20040026629
Publication date
Feb 12, 2004
Tadashi Fujieda
B82 - NANO-TECHNOLOGY
Information
Patent Application
Magnetic carbon nanotube
Publication number
20030224170
Publication date
Dec 4, 2003
Shuichi Suzuki
G01 - MEASURING TESTING
Information
Patent Application
Carbon nanotube connected instrument
Publication number
20030156985
Publication date
Aug 21, 2003
Kishio Hidaka
G01 - MEASURING TESTING
Information
Patent Application
Electromagnetic wave absorption material and an associated device
Publication number
20030155143
Publication date
Aug 21, 2003
Tadashi Fujieda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR