Kiwamu Takehisa

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mask inspection apparatus, switching method, and mask inspection me...
- Patent number 10,801,967
- Issue date Oct 13, 2020
- Lasertec Corporation
- Tetsuya Sendoda
- G01 - MEASURING TESTING
Information Patent Grant
Correction method, correction apparatus, and inspection apparatus
- Patent number 10,706,527
- Issue date Jul 7, 2020
- Lasertec Corporation
- Tsunehito Kohyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus of EUV mask and its focus adjustment method
- Patent number 10,319,088
- Issue date Jun 11, 2019
- Lasertec Corporation
- Hiroki Miyai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection apparatus and mask inspection method
- Patent number 10,156,664
- Issue date Dec 18, 2018
- Lasertec Corporation
- Kiwamu Takehisa
- B08 - CLEANING
Information Patent Grant
Laser light source device and inspection device
- Patent number 9,991,670
- Issue date Jun 5, 2018
- Lasertec Corporation
- Kiwamu Takehisa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometer and phase shift amount measuring apparatus with diff...
- Patent number 9,719,859
- Issue date Aug 1, 2017
- LASERTEC CORPORATION
- Haruhiko Kusunose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pellicle inspection apparatus
- Patent number 9,588,421
- Issue date Mar 7, 2017
- Lasertec Corporation
- Kiwamu Takehisa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pulsed iodine laser apparatus
- Patent number 9,583,908
- Issue date Feb 28, 2017
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser processing method and laser processing system
- Patent number 9,350,137
- Issue date May 24, 2016
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxygen laser oscillator
- Patent number 9,209,594
- Issue date Dec 8, 2015
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxygen laser oscillator
- Patent number 9,142,934
- Issue date Sep 22, 2015
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid crystal display and light guide plate
- Patent number 8,130,340
- Issue date Mar 6, 2012
- TOHOKU UNIVERSITY
- Tadahiro Ohmi
- G02 - OPTICS
Information Patent Grant
Photomask inspection apparatus
- Patent number 7,796,343
- Issue date Sep 14, 2010
- Lasertec Corporation
- Kiwamu Takehisa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Backlight unit for liquid crystal display
- Patent number 7,787,076
- Issue date Aug 31, 2010
- Tohoku University
- Tadahiro Ohmi
- G02 - OPTICS
Information Patent Grant
Illumination apparatus and illumination method
- Patent number 7,764,414
- Issue date Jul 27, 2010
- Lasertec Corporation
- Haruhiko Kusunose
- G02 - OPTICS
Information Patent Grant
Pattern writing system and pattern writing method
- Patent number 7,663,734
- Issue date Feb 16, 2010
- Tadahiro Ohmi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask making method, mask making device, and mask drawing device
- Patent number 7,474,383
- Issue date Jan 6, 2009
- Tadahiro Ohmi
- Tadahiro Ohmi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Oscillation method and device of fluorine molecular laser
- Patent number 7,099,365
- Issue date Aug 29, 2006
- Komatsu, Ltd.
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-narrow band flourine laser apparatus
- Patent number 6,839,373
- Issue date Jan 4, 2005
- Komatsu Ltd.
- Kiwamu Takehisa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Arf excimer laser device, scanning type exposure device and ultravi...
- Patent number 6,819,699
- Issue date Nov 16, 2004
- Komatsu Ltd.
- Tatsuo Enami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wavelength detection device for line-narrowed laser apparatus and u...
- Patent number 6,628,682
- Issue date Sep 30, 2003
- Komatsu Ltd.
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra narrow band fluorine laser apparatus and fluorine exposure ap...
- Patent number 6,594,291
- Issue date Jul 15, 2003
- Komatsu Ltd.
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorine laser device
- Patent number 6,560,269
- Issue date May 6, 2003
- Komatsu, Ltd.
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-power solid-state laser resonator
- Patent number 5,381,437
- Issue date Jan 10, 1995
- Hitachi, Ltd.
- Kouji Kuwabara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for generation of singlet-delta oxygen
- Patent number 4,643,889
- Issue date Feb 17, 1987
- Mitsui Grinding Wheel Co., Ltd.
- Taro Uchiyama
- C01 - INORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
NEAR-INFRARED SPOT LIGHT SOURCE AND CANCER TREATMENT SYSTEM
- Publication number 20240366956
- Publication date Nov 7, 2024
- Kiwamu TAKEHISA
- Kiwamu TAKEHISA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20210247323
- Publication date Aug 12, 2021
- Lasertec Corporation
- Kiwamu TAKEHISA
- G01 - MEASURING TESTING
Information Patent Application
MASK INSPECTION APPARATUS, SWITCHING METHOD, AND MASK INSPECTION ME...
- Publication number 20200182803
- Publication date Jun 11, 2020
- Lasertec Corporation
- Tetsuya SENDODA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION METHOD, CORRECTION APPARATUS, AND INSPECTION APPARATUS
- Publication number 20180276812
- Publication date Sep 27, 2018
- Lasertec Corporation
- Tsunehito KOHYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER PROCESSING METHOD AND LASER PROCESSING SYSTEM
- Publication number 20180250768
- Publication date Sep 6, 2018
- Kiwamu TAKEHISA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER DEFENSE SYSTEM AND HIGH ALTITUDE AIRSHIP
- Publication number 20180252504
- Publication date Sep 6, 2018
- Kiwamu TAKEHISA
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
INSPECTION APPARATUS AND ITS FOCUS ADJUSTMENT METHOD
- Publication number 20170256045
- Publication date Sep 7, 2017
- Lasertec Corporation
- Hiroki Miyai
- G01 - MEASURING TESTING
Information Patent Application
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD
- Publication number 20170235031
- Publication date Aug 17, 2017
- Lasertec Corporation
- Kiwamu TAKEHISA
- B08 - CLEANING
Information Patent Application
PULSED IODINE LASER APPARATUS
- Publication number 20160365695
- Publication date Dec 15, 2016
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PELLICLE INSPECTION APPARATUS
- Publication number 20150293460
- Publication date Oct 15, 2015
- Lasertec Corporation
- Kiwamu TAKEHISA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LASER LIGHT SOURCE DEVICE AND INSPECTION DEVICE
- Publication number 20150244142
- Publication date Aug 27, 2015
- Lasertec Corporation
- Kiwamu TAKEHISA
- G02 - OPTICS
Information Patent Application
OXYGEN LASER OSCILLATOR
- Publication number 20150214694
- Publication date Jul 30, 2015
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETER AND PHASE SHIFT AMOUNT MEASURING APPARATUS
- Publication number 20150204729
- Publication date Jul 23, 2015
- Lasertec Corporation
- Haruhiko KUSUNOSE
- G01 - MEASURING TESTING
Information Patent Application
OXYGEN LASER OSCILLATOR
- Publication number 20150171591
- Publication date Jun 18, 2015
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA SHIELD DEVICE AND PLASMA SOURCE APPARATUS
- Publication number 20130234597
- Publication date Sep 12, 2013
- Lasertec Corporation
- Haruhiko KUSUNOSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backlight Unit for Liquid Crystal Display
- Publication number 20090231514
- Publication date Sep 17, 2009
- TOHOKU UNIVERSITY
- Tadahiro Ohmi
- G02 - OPTICS
Information Patent Application
PHOTOMASK INSPECTION APPARATUS
- Publication number 20090168191
- Publication date Jul 2, 2009
- Lasertec Corporation
- Kiwamu Takehisa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Liquid crystal display and light guide plate
- Publication number 20090103009
- Publication date Apr 23, 2009
- TOHOKU UNIVERSITY
- Tadahiro Ohmi
- G02 - OPTICS
Information Patent Application
Solar Cell Panel
- Publication number 20080302406
- Publication date Dec 11, 2008
- TOHOKU UNIVERSITY
- Tadahiro Ohmi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ILLUMINATION APPARATUS AND ILLUMINATION METHOD
- Publication number 20080144148
- Publication date Jun 19, 2008
- Lasertec Corporation
- Haruhiko Kusunose
- G02 - OPTICS
Information Patent Application
Exposure Apparatus
- Publication number 20070207601
- Publication date Sep 6, 2007
- Tohoku University
- Tadahiro Ohmi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron beam exposure device and exposure method
- Publication number 20060252160
- Publication date Nov 9, 2006
- Tadahiro OHMI
- Tadahiro Ohmi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Exposure apparatus for liquid crystal panel and exposure apparatus
- Publication number 20060176454
- Publication date Aug 10, 2006
- Tadahiro Ohmi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
Pattern plotting device and pattern plotting method
- Publication number 20060147841
- Publication date Jul 6, 2006
- Tadahiro OHMI Ball Semiconductor Inc.
- Tadahiro Ohmi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask making method, mask making device, and mask drawing device
- Publication number 20060132591
- Publication date Jun 22, 2006
- TADAHIRO OHMI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask repeater and mask manufacturing method
- Publication number 20060104413
- Publication date May 18, 2006
- Tadahiro OHMI
- Tadahiro Ohmi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Oscillation method and device of fluorine molecular laser
- Publication number 20030081643
- Publication date May 1, 2003
- Kiwamu Takehisa
- H01 - BASIC ELECTRIC ELEMENTS

Kiwamu Takehisa

Person

Patents Grantslast 30 patents

Mask inspection apparatus, switching method, and mask inspection me...

Correction method, correction apparatus, and inspection apparatus

Inspection apparatus of EUV mask and its focus adjustment method

Mask inspection apparatus and mask inspection method

Laser light source device and inspection device

Interferometer and phase shift amount measuring apparatus with diff...

Pellicle inspection apparatus

Pulsed iodine laser apparatus

Laser processing method and laser processing system

Oxygen laser oscillator

Oxygen laser oscillator

Liquid crystal display and light guide plate

Photomask inspection apparatus

Backlight unit for liquid crystal display

Illumination apparatus and illumination method

Pattern writing system and pattern writing method

Mask making method, mask making device, and mask drawing device

Oscillation method and device of fluorine molecular laser

Ultra-narrow band flourine laser apparatus

Arf excimer laser device, scanning type exposure device and ultravi...

Wavelength detection device for line-narrowed laser apparatus and u...

Ultra narrow band fluorine laser apparatus and fluorine exposure ap...

Fluorine laser device

High-power solid-state laser resonator

System for generation of singlet-delta oxygen

Patents Applicationslast 30 patents

NEAR-INFRARED SPOT LIGHT SOURCE AND CANCER TREATMENT SYSTEM

INSPECTION DEVICE AND INSPECTION METHOD

MASK INSPECTION APPARATUS, SWITCHING METHOD, AND MASK INSPECTION ME...

CORRECTION METHOD, CORRECTION APPARATUS, AND INSPECTION APPARATUS

LASER PROCESSING METHOD AND LASER PROCESSING SYSTEM

LASER DEFENSE SYSTEM AND HIGH ALTITUDE AIRSHIP

INSPECTION APPARATUS AND ITS FOCUS ADJUSTMENT METHOD

MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD

PULSED IODINE LASER APPARATUS

PELLICLE INSPECTION APPARATUS

LASER LIGHT SOURCE DEVICE AND INSPECTION DEVICE

OXYGEN LASER OSCILLATOR

INTERFEROMETER AND PHASE SHIFT AMOUNT MEASURING APPARATUS

OXYGEN LASER OSCILLATOR

PLASMA SHIELD DEVICE AND PLASMA SOURCE APPARATUS

Backlight Unit for Liquid Crystal Display

PHOTOMASK INSPECTION APPARATUS

Liquid crystal display and light guide plate

Solar Cell Panel

ILLUMINATION APPARATUS AND ILLUMINATION METHOD

Exposure Apparatus

Electron beam exposure device and exposure method

Exposure apparatus for liquid crystal panel and exposure apparatus

Pattern plotting device and pattern plotting method

Mask making method, mask making device, and mask drawing device

Mask repeater and mask manufacturing method

Oscillation method and device of fluorine molecular laser