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Kiyofumi Matsuda
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Musashi-Murayama, JP
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Patents Grants
last 30 patents
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Patent Grant
Shearing interferometer for measuring lens lateral aberration
Patent number
5,355,218
Issue date
Oct 11, 1994
Agency of Industrial Science and Technology
Kiyofumi Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Time series signal multichannel frequency analyzer using liquid cry...
Patent number
5,335,058
Issue date
Aug 2, 1994
Agency of Industrial Science and Technology
Tomoaki Eiju
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High stability interferometer for measuring small changes in refrac...
Patent number
5,074,666
Issue date
Dec 24, 1991
Agency of Industrial Science and Technology
Thomas H. Barnes
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for achieving optical spatial phase modulation
Patent number
5,018,838
Issue date
May 28, 1991
Agency of Industrial Science and Technology
Thomas H. Barnes
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for three-dimensional viewing of magnetic resonance imagi...
Patent number
4,983,004
Issue date
Jan 8, 1991
Agency of Industrial Science and Technology
Naoya Takeya
G02 - OPTICS
Information
Patent Grant
Device for detection of center of rotation of rotating object
Patent number
4,529,310
Issue date
Jul 16, 1985
Agency of Industrial Science and Technology
Kiyofumi Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Holographic straightness meter
Patent number
4,466,693
Issue date
Aug 21, 1984
Agency of Industrial Science and Technology
Kiyofumi Matsuda
G02 - OPTICS
Information
Patent Grant
Laser doppler velocimeter
Patent number
4,397,550
Issue date
Aug 9, 1983
Agency of Industrial Science and Technology
Kiyofumi Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Holographic shearing interference contrast method and interferometer
Patent number
4,272,192
Issue date
Jun 9, 1981
Agency of Industrial Science and Technology
Kiyofumi Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Holographic shearing interferometer
Patent number
4,118,124
Issue date
Oct 3, 1978
Agency of Industrial Science and Technology
Kiyofumi Matsuda
G01 - MEASURING TESTING