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Micrometer
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Patent number 6,176,021
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Issue date Jan 23, 2001
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Mitutoyo Corporation
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Hajime Sato
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G01 - MEASURING TESTING
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Micrometer
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Patent number D263809
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Issue date Apr 13, 1982
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Mitutoyo Mfg. Co., Ltd.
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Hiroaki Suwa
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D10 - Measuring, testing, or signalling instruments
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Measuring instrument
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Patent number 4,174,575
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Issue date Nov 20, 1979
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Kabushiki Kaisha Mitutoyo Seisakusho
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Kiyohiro Nakata
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G01 - MEASURING TESTING