Kiyohisa Fujita

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Hamamatsu-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Wavelength dependence measuring system
- Patent number 6,900,883
- Issue date May 31, 2005
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Polarization dependent loss measuring apparatus
- Patent number 6,798,510
- Issue date Sep 28, 2004
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for sweep synchronization measurement of optical waveleng...
- Patent number 6,686,578
- Issue date Feb 3, 2004
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Sweep synchronization testing
- Patent number 6,646,428
- Issue date Nov 11, 2003
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wavelength dependence measuring system
- Publication number 20030164940
- Publication date Sep 4, 2003
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Application
Polarization dependent loss measuring apparatus
- Publication number 20030117625
- Publication date Jun 26, 2003
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for sweep synchronization measurement of optical waveleng...
- Publication number 20020008194
- Publication date Jan 24, 2002
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Application
Sweep synchronization testing
- Publication number 20020000799
- Publication date Jan 3, 2002
- Kiyohisa Fujita
- G01 - MEASURING TESTING