Kiyokawa Toshiyuki

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer scale active thermal interposer for device testing
- Patent number 12,320,841
- Issue date Jun 3, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
- Publication number 20250130276
- Publication date Apr 24, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...
- Publication number 20240183897
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
- Publication number 20220155364
- Publication date May 19, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL