Kiyokazu Okamoto

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Amplitude-detecting method and circuit
- Patent number 6,937,070
- Issue date Aug 30, 2005
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Vibration detecting system of resilient body and vibrating contact...
- Patent number 6,848,315
- Issue date Feb 1, 2005
- Mitutoyo Corporation
- Kaoru Matsuki
- G01 - MEASURING TESTING
Information Patent Grant
Method of suppressing geometric distortion of an image space
- Patent number 6,671,423
- Issue date Dec 30, 2003
- Mitutoyo Corporation
- Ikumatsu Fujimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring opposite surfaces
- Patent number 6,633,387
- Issue date Oct 14, 2003
- Mitutoyo Corporation
- Kiyokazu Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic geometry measuring device
- Patent number 6,604,295
- Issue date Aug 12, 2003
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-stabilized light source apparatus
- Patent number 6,490,300
- Issue date Dec 3, 2002
- Mitutoyo Corporation
- Nobuhisa Nishioki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface configuration measuring method
- Patent number 6,484,571
- Issue date Nov 26, 2002
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive distance sensor for surface configuration determining ap...
- Patent number 6,480,008
- Issue date Nov 12, 2002
- Mitutoyo Corporation
- Kiyokazu Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Movement control mechanism of contact-type vibrating probe
- Patent number 6,457,366
- Issue date Oct 1, 2002
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Contact location detecting mechanism of touch signal probe
- Patent number 6,307,084
- Issue date Oct 23, 2001
- Mitutoyo Corporation
- Kaoru Matsuki
- G01 - MEASURING TESTING
Information Patent Grant
Phase delay correction system
- Patent number 6,301,550
- Issue date Oct 9, 2001
- Mitutoyo Corporation
- Kiyokazu Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Length measuring machine and method using laser beams
- Patent number 6,034,773
- Issue date Mar 7, 2000
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Interpolation pulse generating device with two-step interpolation
- Patent number 5,734,688
- Issue date Mar 31, 1998
- Mitutoyo Corporation
- Mikiya Teraguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microscopic geometry measuring device
- Publication number 20020124427
- Publication date Sep 12, 2002
- Mitutoyo Corporation
- Kunitoshi Nishimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Vibration detecting system of resilient body and vibrating contact...
- Publication number 20020108446
- Publication date Aug 15, 2002
- Mitutoyo Corporation
- Kaoru Matsuki
- G01 - MEASURING TESTING
Information Patent Application
Capacitive distance sensor for surface configuration determining ap...
- Publication number 20020021133
- Publication date Feb 21, 2002
- Kiyokazu Okamoto
- G01 - MEASURING TESTING
Information Patent Application
Amplitude-detecting method and circuit
- Publication number 20020016160
- Publication date Feb 7, 2002
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING

Kiyokazu Okamoto

Person

Patents Grantslast 30 patents

Amplitude-detecting method and circuit

Vibration detecting system of resilient body and vibrating contact...

Method of suppressing geometric distortion of an image space

Method and apparatus for measuring opposite surfaces

Microscopic geometry measuring device

Wavelength-stabilized light source apparatus

Surface configuration measuring method

Capacitive distance sensor for surface configuration determining ap...

Movement control mechanism of contact-type vibrating probe

Contact location detecting mechanism of touch signal probe

Phase delay correction system

Length measuring machine and method using laser beams

Interpolation pulse generating device with two-step interpolation

Patents Applicationslast 30 patents

Microscopic geometry measuring device

Vibration detecting system of resilient body and vibrating contact...

Capacitive distance sensor for surface configuration determining ap...

Amplitude-detecting method and circuit