Kiyoko YAMANAKA

Person

  • Tachikawa, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Inertial sensor

    • Patent number 9,970,956
    • Issue date May 15, 2018
    • Hitachi Automotive Systems, Ltd.
    • Yuhua Zhang
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inertial sensor

    • Patent number 9,804,188
    • Issue date Oct 31, 2017
    • Hitachi Automotive Systems, Ltd.
    • Heewon Jeong
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Angular velocity sensor

    • Patent number 9,568,490
    • Issue date Feb 14, 2017
    • Hitachi Automotive Systems, Ltd.
    • Heewon Jeong
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor physical quantity detecting sensor

    • Patent number 9,511,993
    • Issue date Dec 6, 2016
    • Hitachi Automotive Systems, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Inertial sensor

    • Patent number 9,229,025
    • Issue date Jan 5, 2016
    • Hitachi Automotive Systems, Ltd.
    • Kiyoko Yamanaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Combined sensor

    • Patent number 9,000,543
    • Issue date Apr 7, 2015
    • Hitachi Automotive Systems, Ltd.
    • Heewon Jeong
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Physical quantity detector

    • Patent number 8,659,101
    • Issue date Feb 25, 2014
    • Hitachi Automotive Systems, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Inertial sensor and method of manufacturing the same

    • Patent number 8,429,969
    • Issue date Apr 30, 2013
    • Hitachi, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Capacitance sensor

    • Patent number 8,427,177
    • Issue date Apr 23, 2013
    • Hitachi Automotive Systems, Ltd.
    • Heewon Jeong
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inertial sensor

    • Patent number 8,250,920
    • Issue date Aug 28, 2012
    • Hitachi, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Inertial sensor

    • Patent number 8,096,180
    • Issue date Jan 17, 2012
    • Hitachi, Ltd.
    • Kiyoko Yamanaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device with integrated circuit electrically connected...

    • Patent number 7,919,814
    • Issue date Apr 5, 2011
    • Hitachi, Ltd.
    • Yasushi Goto
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Switch, semiconductor device, and manufacturing method thereof

    • Patent number 7,667,559
    • Issue date Feb 23, 2010
    • Hitachi, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Actuator system

    • Patent number 7,567,019
    • Issue date Jul 28, 2009
    • Hitachi, Ltd.
    • Kiyoko Yamanaka
    • G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

  • Information Patent Application

    ACCELERATION DETECTION DEVICE

    • Publication number 20170219620
    • Publication date Aug 3, 2017
    • Hitachi Automotive Systems, Ltd.
    • Heewon JEONG
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inertial Sensor

    • Publication number 20150355218
    • Publication date Dec 10, 2015
    • Hitachi Automotive Systems, Ltd.
    • Heewon Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inertial Sensor

    • Publication number 20150301075
    • Publication date Oct 22, 2015
    • Hitachi Automotive Systems, Ltd.
    • Kiyoko Yamanaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANGULAR VELOCITY SENSOR

    • Publication number 20150096373
    • Publication date Apr 9, 2015
    • Hitachi Automotive Systems, Ltd.
    • Heewon Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inertial Sensor Module

    • Publication number 20150040670
    • Publication date Feb 12, 2015
    • Kiyoko Yamanaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inertial Sensor

    • Publication number 20140007685
    • Publication date Jan 9, 2014
    • Yuhua ZHANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor Physical Quantity Detecting Sensor

    • Publication number 20130346015
    • Publication date Dec 26, 2013
    • Hitachi Automotive Systems, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Combined Sensor

    • Publication number 20130285172
    • Publication date Oct 31, 2013
    • Hitachi Automotive Systems, Ltd.
    • Heewon Jeong
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Physical Quantity Detector

    • Publication number 20130241013
    • Publication date Sep 19, 2013
    • Hitachi Automotive Systems, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Inertial Sensor

    • Publication number 20130133422
    • Publication date May 30, 2013
    • Hitachi Automotive Systems, Ltd.
    • Kiyoko Yamanaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inertial Sensor

    • Publication number 20110132089
    • Publication date Jun 9, 2011
    • Hitachi, Ltd
    • Heewon Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    Capacitance Sensor

    • Publication number 20110100126
    • Publication date May 5, 2011
    • Hitachi Automotive Systems, Ltd.
    • Heewon JEONG
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inertial Sensor and Method of Manufacturing the Same

    • Publication number 20110048129
    • Publication date Mar 3, 2011
    • Hitachi, Ltd
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SEMICONDUCTOR PHYSICAL QUANTITY SENSOR AND CONTROL DEVICE USING THE...

    • Publication number 20100127715
    • Publication date May 27, 2010
    • Hitachi, Ltd.
    • Heewon Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    INERTIAL SENSOR

    • Publication number 20090183568
    • Publication date Jul 23, 2009
    • Hitachi, Ltd.
    • Kiyoko YAMANAKA
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Semiconductor device and method of manufacturing the same

    • Publication number 20090134459
    • Publication date May 28, 2009
    • Yasushi GOTO
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    INERTIAL SENSOR

    • Publication number 20090126491
    • Publication date May 21, 2009
    • Hitachi, Ltd.
    • Kiyoko YAMANAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe memory device and positioning method therefor

    • Publication number 20070030791
    • Publication date Feb 8, 2007
    • Hitachi, Ltd.
    • Takehiko Hasebe
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    Switch, semiconductor device, and manufacturing method thereof

    • Publication number 20070018761
    • Publication date Jan 25, 2007
    • Hitachi, Ltd.
    • Kiyoko Yamanaka
    • B81 - MICRO-STRUCTURAL TECHNOLOGY