Kiyonobu Suzuki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus, test apparatus, and measurement method
- Patent number 7,518,377
- Issue date Apr 14, 2009
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement apparatus, test apparatus, and measurement method
- Publication number 20070197168
- Publication date Aug 23, 2007
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING