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Kiyoshi Adachi
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device capable of accurately producing internal multi...
Patent number
6,859,079
Issue date
Feb 22, 2005
Renesas Technology Corp.
Yoshiyuki Haraguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor memory and its test method
Patent number
6,469,946
Issue date
Oct 22, 2002
Mitsubishi Denki Kabushiki Kaisha
Takashi Utsumi
G11 - INFORMATION STORAGE
Information
Patent Grant
Load capacitance measuring circuit and output buffer adaptive to wi...
Patent number
6,353,337
Issue date
Mar 5, 2002
Mitsubishi Denki Kabushiki Kaisha
Koji Nasu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for preventing transferring noise of digital signal
Patent number
5,514,993
Issue date
May 7, 1996
Mitsubishi Denki Kabushiki Kaisha
Kiyoshi Adachi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Microcomputer
Patent number
5,483,471
Issue date
Jan 9, 1996
Mitsubishi Denki Kabushiki Kaisha
Kiyoshi Adachi
G11 - INFORMATION STORAGE
Information
Patent Grant
Voltage change circuit for a microcomputer
Patent number
5,350,951
Issue date
Sep 27, 1994
Mitsubishi Denki Kabushiki Kaisha
Kiyoshi Adachi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Void detecting device
Patent number
4,144,741
Issue date
Mar 20, 1979
Doryokuro Kakunenryo Kaihatsu Jigyodan
Koichiro Nakamoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Communication device performing communication using two clock signa...
Publication number
20040157576
Publication date
Aug 12, 2004
RENESAS TECHNOLOGY CORP.
Kiyoshi Adachi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Semiconductor device capable of accurately producing internal multi...
Publication number
20040104753
Publication date
Jun 3, 2004
RENESAS TECHNOLOGY CORP.
Yoshiyuki Haraguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor device having a semiconductor chip and a lead substra...
Publication number
20030098506
Publication date
May 29, 2003
Yoshiyuki Haraguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor memory and its test method
Publication number
20020054526
Publication date
May 9, 2002
Takashi Utsumi
G11 - INFORMATION STORAGE
Information
Patent Application
Load capacitance measuring circuit and output buffer adaptive to wi...
Publication number
20020008543
Publication date
Jan 24, 2002
Koji Nasu
G01 - MEASURING TESTING