Kiyoshi Hayashi

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Non-volatile semiconductor memory device capable of high speed prog...
- Patent number 5,818,761
- Issue date Oct 6, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Onakado
- G11 - INFORMATION STORAGE
Information Patent Grant
Strain detector
- Patent number 5,313,845
- Issue date May 24, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Strain detector
- Patent number 5,267,476
- Issue date Dec 7, 1993
- Mitsubishi Denki K.K.
- Kiyoshi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a strain detector
- Patent number 4,935,263
- Issue date Jun 19, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Satoh
- G01 - MEASURING TESTING