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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method, system and apparatus of inspection
Patent number
7,679,737
Issue date
Mar 16, 2010
Fujitsu Microelectronics Limited
Naohiro Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting method, inspecting apparatus, and method of manufacturin...
Patent number
7,340,352
Issue date
Mar 4, 2008
Fujitsu Limited
Naohiro Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating a semiconductor device containing nitrogen in...
Patent number
7,005,393
Issue date
Feb 28, 2006
Fujitsu Limited
Kiyoshi Irino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacture method for semiconductor device with patterned film of...
Patent number
6,998,303
Issue date
Feb 14, 2006
Fujitsu Limited
Yoshihiro Sugita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacture system for semiconductor device with thin gate insulati...
Patent number
6,984,267
Issue date
Jan 10, 2006
Fujitsu Limited
Kiyoshi Irino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating a semiconductor device containing nitrogen in...
Patent number
6,979,658
Issue date
Dec 27, 2005
Fujitsu Limited
Kiyoshi Irino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having a high-dielectric gate insulation film...
Patent number
6,894,369
Issue date
May 17, 2005
Fujitsu Limited
Kiyoshi Irino
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Semiconductor device and method for fabricating the same
Patent number
6,780,699
Issue date
Aug 24, 2004
Fujitsu Limited
Yasuyuki Tamura
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Manufacture method and system for semiconductor device with thin ga...
Patent number
6,468,926
Issue date
Oct 22, 2002
Fujitsu Limited
Kiyoshi Irino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor memory device containing nitrogen in a gate oxide film
Patent number
5,990,517
Issue date
Nov 23, 1999
Fujitsu Limited
Kiyoshi Irino
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD, SYSTEM AND APPARATUS OF INSPECTION
Publication number
20080165352
Publication date
Jul 10, 2008
Fujitsu Limited
Naohiro Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Inspecting method, inspecting apparatus, and method of manufacturin...
Publication number
20070255513
Publication date
Nov 1, 2007
FUJITSU LIMITED
Naohiro Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Manufacture method for semiconductor device with patterned film of...
Publication number
20040038555
Publication date
Feb 26, 2004
FUJITSU LIMITED
Yoshihiro Sugita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method for fabricating the same
Publication number
20030168697
Publication date
Sep 11, 2003
FUJITSU LIMITED
Yasuyuki Tamura
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Manufacture system for semiconductor device with thin gate insulati...
Publication number
20030022523
Publication date
Jan 30, 2003
FUJITSU LIMITED
Kiyoshi Irino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method of fabricating the same
Publication number
20030003667
Publication date
Jan 2, 2003
FUJITSU LIMITED
Yusuke Morisaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of fabricating a semiconductor device containing nitrogen in...
Publication number
20020151099
Publication date
Oct 17, 2002
FUJITSU LIMITED
Kiyoshi Irino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having a high-dielectric gate insulation film...
Publication number
20020146916
Publication date
Oct 10, 2002
Kiyoshi Irino
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE CONTAINING NITROGEN IN...
Publication number
20020052087
Publication date
May 2, 2002
KIYOSHI IRINO
H01 - BASIC ELECTRIC ELEMENTS