Kiyoshi Ishibashi

Person

Itami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Thin-film structure and method for manufacturing the same, and acce...
- Patent number 7,371,600
- Issue date May 13, 2008
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Ishibashi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing thin-film structure
- Patent number 7,041,593
- Issue date May 9, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Mika Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Acceleration sensor and method of manufacture thereof
- Patent number 6,958,529
- Issue date Oct 25, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Ishibashi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of manufacturing thin-film structure
- Patent number 6,905,905
- Issue date Jun 14, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Mika Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Substrate and method for producing the same, and thin film structure
- Patent number 6,900,071
- Issue date May 31, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Mika Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electrode structure, and method for manufacturing thin-film structure
- Patent number 6,812,568
- Issue date Nov 2, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Makio Horikawa
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing thin-film structure
- Patent number 6,784,011
- Issue date Aug 31, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Mika Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of making mold-packaged pressure sensing semiconductor device
- Patent number 5,424,249
- Issue date Jun 13, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing semiconductor pressure sensor
- Patent number 5,394,751
- Issue date Mar 7, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing silicon semiconductor acceleration sensor d...
- Patent number 5,202,281
- Issue date Apr 13, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 4,924,286
- Issue date May 8, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure sensor
- Patent number 4,400,682
- Issue date Aug 23, 1983
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoshi Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of making plastic encapsulated semiconductor devices
- Patent number 4,283,838
- Issue date Aug 18, 1981
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Yamane
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Substrate and method for producing the same, and thin film structure
- Publication number 20040021186
- Publication date Feb 5, 2004
- Mika Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for manufacturing thin-film structure
- Publication number 20040020897
- Publication date Feb 5, 2004
- Mika Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Electrode structure, and method for manufacturing thin-film structure
- Publication number 20030190817
- Publication date Oct 9, 2003
- Makio Horikawa
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for manufacturing thin-film structure
- Publication number 20030186480
- Publication date Oct 2, 2003
- Mika Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Thin-film structure and method for manufacturing the same, and acce...
- Publication number 20030180981
- Publication date Sep 25, 2003
- Kiyoshi Ishibashi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for manufacturing thin-film structure
- Publication number 20030176008
- Publication date Sep 18, 2003
- Mika Okumura
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATION SENSOR AND METHOD OF MANUFACTURE THEROF
- Publication number 20030155622
- Publication date Aug 21, 2003
- Kiyoshi Ishibashi
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Kiyoshi Ishibashi

Person

Patents Grantslast 30 patents

Thin-film structure and method for manufacturing the same, and acce...

Method for manufacturing thin-film structure

Acceleration sensor and method of manufacture thereof

Method of manufacturing thin-film structure

Substrate and method for producing the same, and thin film structure

Electrode structure, and method for manufacturing thin-film structure

Method for manufacturing thin-film structure

Method of making mold-packaged pressure sensing semiconductor device

Method of producing semiconductor pressure sensor

Method of manufacturing silicon semiconductor acceleration sensor d...

Semiconductor device

Pressure sensor

Method of making plastic encapsulated semiconductor devices

Patents Applicationslast 30 patents

Substrate and method for producing the same, and thin film structure

Method for manufacturing thin-film structure

Electrode structure, and method for manufacturing thin-film structure

Method for manufacturing thin-film structure

Thin-film structure and method for manufacturing the same, and acce...

Method for manufacturing thin-film structure

ACCELERATION SENSOR AND METHOD OF MANUFACTURE THEROF