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Kiyoshi Kawatsu
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Tokyo, JP
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last 30 patents
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Patent Grant
Method and apparatus for preparing specimen
Patent number
7,531,794
Issue date
May 12, 2009
Jeol Ltd.
Tadanori Yoshioka
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and apparatus for preparing specimen
Publication number
20060255295
Publication date
Nov 16, 2006
JEOL Ltd.
Tadanori Yoshioka
G01 - MEASURING TESTING