Kiyoshi Nikawa

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspection and fault analysis
- Patent number 8,090,191
- Issue date Jan 3, 2012
- Renesas Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Grant
Failure analysis method and failure analysis apparatus
- Patent number 7,825,673
- Issue date Nov 2, 2010
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing apparatus and non-destructive testing method
- Patent number 7,495,449
- Issue date Feb 24, 2009
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing apparatus and non-destructive testing method
- Patent number 7,484,883
- Issue date Feb 3, 2009
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and apparatus using scanning laser SQUID microscope
- Patent number 7,250,758
- Issue date Jul 31, 2007
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for diagnosing fault in semiconductor device
- Patent number 7,173,447
- Issue date Feb 6, 2007
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for nondestructive inspection on semiconductor de...
- Patent number 6,759,259
- Issue date Jul 6, 2004
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for nondestructive inspection on semiconductor de...
- Patent number 6,610,918
- Issue date Aug 26, 2003
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND FAULT ANALYSIS
- Publication number 20090003685
- Publication date Jan 1, 2009
- NEC ELECTRONICS CORPORATION
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Application
FAILURE ANALYSIS METHOD AND FAILURE ANALYSIS APPARATUS
- Publication number 20090002000
- Publication date Jan 1, 2009
- NEC ELECTRONICS CORPORATION
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND APPARATUS USING SCANNING LASER SQUID MICROSCOPE
- Publication number 20070152664
- Publication date Jul 5, 2007
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive testing apparatus and non-destructive testing method
- Publication number 20070115003
- Publication date May 24, 2007
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and device for semiconductor equipment
- Publication number 20070103151
- Publication date May 10, 2007
- NEC ELECTRONICS CORPORATION
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive testing apparatus and non-destructive testing method
- Publication number 20060280222
- Publication date Dec 14, 2006
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for diagnosing fault in semiconductor device
- Publication number 20060006886
- Publication date Jan 12, 2006
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive and noncontact analysis system
- Publication number 20050140367
- Publication date Jun 30, 2005
- NEC Electronics Corporation
- Kiyoshi Nikawa
- G01 - MEASURING TESTING

Kiyoshi Nikawa

Person

Patents Grantslast 30 patents

Method and apparatus for inspection and fault analysis

Failure analysis method and failure analysis apparatus

Non-destructive testing apparatus and non-destructive testing method

Non-destructive testing apparatus and non-destructive testing method

Inspection method and apparatus using scanning laser SQUID microscope

Method and apparatus for diagnosing fault in semiconductor device

Device and method for nondestructive inspection on semiconductor de...

Device and method for nondestructive inspection on semiconductor de...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR INSPECTION AND FAULT ANALYSIS

FAILURE ANALYSIS METHOD AND FAILURE ANALYSIS APPARATUS

INSPECTION METHOD AND APPARATUS USING SCANNING LASER SQUID MICROSCOPE

Non-destructive testing apparatus and non-destructive testing method

Inspection method and device for semiconductor equipment

Non-destructive testing apparatus and non-destructive testing method

Method and apparatus for diagnosing fault in semiconductor device

Nondestructive and noncontact analysis system