Kiyoshi NUMATA

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Kyoto, JP

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Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PRODUCING MI ELEMENT AND MI ELEMENT
- Publication number 20200300930
- Publication date Sep 24, 2020
- Masami YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE STRUCTURE AND METHOD FOR PRODUCING PROBE STRUCTURE
- Publication number 20200041543
- Publication date Feb 6, 2020
- NIDEC-READ CORPORATION
- Michihisa MAEDA
- B82 - NANO-TECHNOLOGY
Information Patent Application
CONTACT CONDUCTION JIG AND INSPECTION DEVICE
- Publication number 20190293684
- Publication date Sep 26, 2019
- NIDEC-READ CORPORATION
- Kiyoshi NUMATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION JIG AND CONTACT
- Publication number 20140028343
- Publication date Jan 30, 2014
- Kiyoshi NUMATA
- G01 - MEASURING TESTING