TREA

Kiyoshi OGAWA

Follow

Person

  • Kyoto, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Mass spectrometer, sampling probe, and analysis method
    • Patent number 10,930,488
    • Issue date Feb 23, 2021
    • Shimadzu Corporation
    • Osamu Furuhashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion analyzer
    • Patent number 10,541,125
    • Issue date Jan 21, 2020
    • Shimadzu Corporation
    • Hiroyuki Miura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass-analysis data processing method and system
    • Patent number 10,012,572
    • Issue date Jul 3, 2018
    • Japanese Foundation for Cancer Research, Keio University, National University...
    • Masaaki Matsuura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Sample preparation device to form a matrix film for matrix assisted...
    • Patent number 9,334,569
    • Issue date May 10, 2016
    • Shimadzu Corporation
    • Kazuteru Takahashi
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,816,274
    • Issue date Aug 26, 2014
    • Shimadzu Corporation
    • Kiyoshi Ogawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Mass analysis data processing method and mass spectrometer
    • Patent number 8,612,162
    • Issue date Dec 17, 2013
    • Shimadzu Corporation
    • Osamu Furuhashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,395,116
    • Issue date Mar 12, 2013
    • Shimadzu Corporation
    • Takahiro Harada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trap time-of-flight mass spectrometer
    • Patent number 8,247,763
    • Issue date Aug 21, 2012
    • Shimadzu Corporation
    • Hideaki Izumi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,058,610
    • Issue date Nov 15, 2011
    • Shimadzu Corporation
    • Takahiro Harada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,928,372
    • Issue date Apr 19, 2011
    • Shimadzu Corporation
    • Shinichi Yamaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,858,937
    • Issue date Dec 28, 2010
    • Shimadzu Corporation
    • Kiyoshi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,759,640
    • Issue date Jul 20, 2010
    • Shimadzu Corporation
    • Mitsutoshi Setou
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trap mass spectrometer
    • Patent number 7,683,316
    • Issue date Mar 23, 2010
    • Shimadzu Corporation
    • Kengo Takeshita
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trap mass spectrometry
    • Patent number 7,582,866
    • Issue date Sep 1, 2009
    • Shimadzu Corporation
    • Osamu Furuhashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,550,716
    • Issue date Jun 23, 2009
    • Shimadzu Corporation
    • Osamu Furuhashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Laser irradiation mass spectrometer
    • Patent number 7,501,620
    • Issue date Mar 10, 2009
    • Shimadzu Corporation
    • Kiyoshi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20210042943
    • Publication date Feb 11, 2021
    • Shimadzu Corporation
    • Ryuta MATSUMOTO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD
    • Publication number 20200328071
    • Publication date Oct 15, 2020
    • Shimadzu Corporation
    • Osamu FURUHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20200266046
    • Publication date Aug 20, 2020
    • Shimadzu Corporation
    • Osamu FURUHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION ANALYZER
    • Publication number 20190189418
    • Publication date Jun 20, 2019
    • Shimadzu Corporation
    • Hiroyuki MIURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SAMPLE PREPARATION DEVICE FOR MALDI AND SAMPLE PREPARATION METHOD
    • Publication number 20130171349
    • Publication date Jul 4, 2013
    • Shimadzu Corporation
    • Kazuteru TAKAHASHI
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    Mass-Analysis Data Processing Method and System
    • Publication number 20120278037
    • Publication date Nov 1, 2012
    • Japanese Foundation for Cancer Research
    • Masaaki MATSUURA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20120132799
    • Publication date May 31, 2012
    • SHIMADZU CORPORATION
    • Kazuteru Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20120104247
    • Publication date May 3, 2012
    • SHIMADZU CORPORATION
    • Kiyoshi Ogawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20110315874
    • Publication date Dec 29, 2011
    • SHIMADZU CORPORATION
    • Masahiro Ikegami
    • G01 - MEASURING TESTING
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20110266438
    • Publication date Nov 3, 2011
    • National University Corporation Hamamatsu University School of Medicine
    • Takahiro HARADA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Analysis Data Processing Method and Mass Spectrometer
    • Publication number 20110231109
    • Publication date Sep 22, 2011
    • Shimadzu Corporation
    • Osamu FURUHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20110168883
    • Publication date Jul 14, 2011
    • Shimadzu Corporation
    • Osamu FURUHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20110121175
    • Publication date May 26, 2011
    • Shimadzu Corporation
    • Motohide YASUNO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20100044563
    • Publication date Feb 25, 2010
    • Takahiro Harada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION TRAP TIME-OF-FLIGHT MASS SPECTROMETER
    • Publication number 20090278042
    • Publication date Nov 12, 2009
    • SHIMADZU CORPORATION
    • Hideaki Izumi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20090272890
    • Publication date Nov 5, 2009
    • SHIMADZU CORPORATION
    • Kiyoshi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETRY APPARATUS AND METHOD
    • Publication number 20090230301
    • Publication date Sep 17, 2009
    • Shimadzu Corporation
    • Osamu furuhashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20090146053
    • Publication date Jun 11, 2009
    • Shimadzu Corporation
    • Mitsutoshi Setou
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION TRAP MASS SPECTROMETRY
    • Publication number 20090090860
    • Publication date Apr 9, 2009
    • Shimadzu Corporation
    • Osamu FURUHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION TRAP MASS SPECTROMETER
    • Publication number 20080277580
    • Publication date Nov 13, 2008
    • Shimadzu Corporation
    • Kengo TAKESHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20080210862
    • Publication date Sep 4, 2008
    • SHIMADZU CORPORATION
    • Shinichi YAMAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Imaging mass spectrometer
    • Publication number 20070114388
    • Publication date May 24, 2007
    • Shimadzu Corporation
    • Kiyoshi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20070085000
    • Publication date Apr 19, 2007
    • Shimadzu Corporation
    • Osamu Furuhashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Laser irradiation mass spectrometer
    • Publication number 20070045527
    • Publication date Mar 1, 2007
    • Shimadzu Corporation
    • Kiyoshi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS