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Kiyoshi Sugaya
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Amagasaki, JP
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last 30 patents
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Patent Grant
Probe card in which contact pressure and relative position of each...
Patent number
5,134,365
Issue date
Jul 28, 1992
Nihon Denshizairyo Kabushiki Kaisha
Kazumasa Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Probe card in which contact pressure and relative position of each...
Patent number
5,055,778
Issue date
Oct 8, 1991
Nihon Denshizairyo Kabushiki Kaisha
Kazumasa Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Ion emmissive head and ion beam irradiation device incorporating th...
Patent number
4,774,413
Issue date
Sep 27, 1988
Nihon Denshizairyo Kabushiki Kaisha
Masao Okubo
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Fused metal ion source with sintered metal head
Patent number
4,638,217
Issue date
Jan 20, 1987
Nihon Denshizairyo Kabushiki Kaisha
Masao Okubo
H01 - BASIC ELECTRIC ELEMENTS