Kiyoshi TAKAMASU

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for reviewing a defect and apparatus
- Patent number 9,733,194
- Issue date Aug 15, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Lighting method and microscopic observation device
- Patent number 9,297,991
- Issue date Mar 29, 2016
- The University of Tokyo
- Satoru Takahashi
- G02 - OPTICS
Information Patent Grant
Method of evaluating precision of output data using error propagation
- Patent number 8,306,787
- Issue date Nov 6, 2012
- Mitutoyo Corporation
- Kiyoshi Takamasu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR REVIEWING A DEFECT AND APPARATUS
- Publication number 20160018340
- Publication date Jan 21, 2016
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING METHOD AND MICROSCOPIC OBSERVATION DEVICE
- Publication number 20150043049
- Publication date Feb 12, 2015
- THE UNIVERSITY OF TOKYO
- Satoru Takahashi
- G02 - OPTICS
Information Patent Application
METHOD OF EVALUATING PRECISION OF OUTPUT DATA USING ERROR PROPAGATION
- Publication number 20110054835
- Publication date Mar 3, 2011
- MITUTOYO CORPORATION
- Kiyoshi TAKAMASU
- G01 - MEASURING TESTING