Kiyoshi Takekoshi

Person

Nirasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 8,456,186
- Issue date Jun 4, 2013
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for inspecting light receiving device
- Patent number 8,120,372
- Issue date Feb 21, 2012
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Dicing method, method of inspecting integrated circuit element, sub...
- Patent number 8,101,436
- Issue date Jan 24, 2012
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Method of manufacturing a probe card
- Patent number 7,716,824
- Issue date May 18, 2010
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing a probe with a trapezoidal contactor
- Patent number 7,621,045
- Issue date Nov 24, 2009
- Tokyo Electron Limited
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Probe and probe card
- Patent number 7,602,203
- Issue date Oct 13, 2009
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus to break the oxide of an electrode by fritting...
- Patent number 7,319,339
- Issue date Jan 15, 2008
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 7,304,489
- Issue date Dec 4, 2007
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Probe with trapezoidal contractor and device based on application t...
- Patent number 7,256,592
- Issue date Aug 14, 2007
- Tokyo Electron Limited
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,242,206
- Issue date Jul 10, 2007
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum prober and vacuum probe method
- Patent number 7,221,176
- Issue date May 22, 2007
- Tokyo Electron Limited
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,091,733
- Issue date Aug 15, 2006
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 7,061,259
- Issue date Jun 13, 2006
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 6,777,967
- Issue date Aug 17, 2004
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection stage having a plurality of Z axes
- Patent number 6,774,621
- Issue date Aug 10, 2004
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Needle load measuring method, needle load setting method and needle...
- Patent number 6,707,310
- Issue date Mar 16, 2004
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with pyramid shaped thin film contacts
- Patent number 6,672,876
- Issue date Jan 6, 2004
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contactor holding mechanism and automatic change mechanism for cont...
- Patent number 6,590,381
- Issue date Jul 8, 2003
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection stage and inspection apparatus having a plurality of Z axes
- Patent number 6,583,614
- Issue date Jun 24, 2003
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection stage including a plurality of Z shafts, and inspection...
- Patent number 6,501,289
- Issue date Dec 31, 2002
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probing card
- Patent number 6,359,455
- Issue date Mar 19, 2002
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus and a method for polishing a probe
- Patent number 6,024,629
- Issue date Feb 15, 2000
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
LCD testing apparatus
- Patent number 5,801,545
- Issue date Sep 1, 1998
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Apparatus for examining target objects such as LCD panels
- Patent number 5,691,764
- Issue date Nov 25, 1997
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Transfer apparatus for plate-like member
- Patent number 4,941,800
- Issue date Jul 17, 1990
- Tokyo Electron Limited
- Hisashi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Moving table apparatus
- Patent number 4,896,869
- Issue date Jan 30, 1990
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD FOR INSPECTING SOLID STATE IMAGING DEVICE
- Publication number 20100013505
- Publication date Jan 21, 2010
- TOKYO ELECTRON LIMITED
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20090144971
- Publication date Jun 11, 2009
- TOYKO ELECTRON LIMITED
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Probe and Probe Card
- Publication number 20080164892
- Publication date Jul 10, 2008
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY EVALUATION TEST APPARATUS, RELIABILITY EVALUATION TEST...
- Publication number 20080018355
- Publication date Jan 24, 2008
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20070229101
- Publication date Oct 4, 2007
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...
- Publication number 20070124932
- Publication date Jun 7, 2007
- TOKYO ELECTRON LIMITED
- Hisatomi HOSAKA
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...
- Publication number 20070126444
- Publication date Jun 7, 2007
- TOKYO ELECTRON LIMITED
- Hisatomi HOSAKA
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus
- Publication number 20060192578
- Publication date Aug 31, 2006
- TOKYO ELECTON LIMITED
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
Reliability evaluation test apparatus, reliability evaluation test...
- Publication number 20050253575
- Publication date Nov 17, 2005
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Vacuum prober and vacuum probe method
- Publication number 20050206396
- Publication date Sep 22, 2005
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Probe with trapezoidal contactor and device based on application th...
- Publication number 20050162179
- Publication date Jul 28, 2005
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Application
Reliability evaluation test apparatus, reliability evaluation test...
- Publication number 20040183561
- Publication date Sep 23, 2004
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus
- Publication number 20040174177
- Publication date Sep 9, 2004
- TOKYO ELECTRON LIMITED
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
Inspection stage having a plurality of Z axes
- Publication number 20030201765
- Publication date Oct 30, 2003
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Needle load measuring method, needle load setting method and needle...
- Publication number 20030117160
- Publication date Jun 26, 2003
- TOKYO ELECTRON LIMITED
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus
- Publication number 20020021142
- Publication date Feb 21, 2002
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
Inspection stage
- Publication number 20010054892
- Publication date Dec 27, 2001
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Needle load measuring method, needle load setting method and needle...
- Publication number 20010013787
- Publication date Aug 16, 2001
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Probe arrangement assembly, method of manufacturing probe arrangeme...
- Publication number 20010009376
- Publication date Jul 26, 2001
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING

Kiyoshi Takekoshi

Person

Patents Grantslast 30 patents

Reliability evaluation test apparatus, reliability evaluation test...

Probe card for inspecting light receiving device

Dicing method, method of inspecting integrated circuit element, sub...

Method of manufacturing a probe card

Method of producing a probe with a trapezoidal contactor

Probe and probe card

Inspection apparatus to break the oxide of an electrode by fritting...

Inspection method and inspection apparatus

Probe with trapezoidal contractor and device based on application t...

Reliability evaluation test apparatus, reliability evaluation test...

Vacuum prober and vacuum probe method

Reliability evaluation test apparatus, reliability evaluation test...

Inspection method and inspection apparatus

Inspection method and inspection apparatus

Inspection stage having a plurality of Z axes

Needle load measuring method, needle load setting method and needle...

Probe card with pyramid shaped thin film contacts

Contactor holding mechanism and automatic change mechanism for cont...

Inspection stage and inspection apparatus having a plurality of Z axes

Inspection stage including a plurality of Z shafts, and inspection...

Probing card

Probe apparatus and a method for polishing a probe

LCD testing apparatus

Apparatus for examining target objects such as LCD panels

Transfer apparatus for plate-like member

Moving table apparatus

Patents Applicationslast 30 patents

PROBE CARD FOR INSPECTING SOLID STATE IMAGING DEVICE

PROBE CARD

Probe and Probe Card

RELIABILITY EVALUATION TEST APPARATUS, RELIABILITY EVALUATION TEST...

INSPECTION METHOD AND INSPECTION APPARATUS

PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...

PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...

Inspection method and inspection apparatus

Reliability evaluation test apparatus, reliability evaluation test...

Vacuum prober and vacuum probe method

Probe with trapezoidal contactor and device based on application th...

Reliability evaluation test apparatus, reliability evaluation test...

Inspection method and inspection apparatus

Inspection stage having a plurality of Z axes

Needle load measuring method, needle load setting method and needle...

Inspection method and inspection apparatus

Inspection stage

Needle load measuring method, needle load setting method and needle...

Probe arrangement assembly, method of manufacturing probe arrangeme...