Kiyoshi Uchikawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Element, system having the element, and judging apparatus
- Patent number 11,791,363
- Issue date Oct 17, 2023
- Nikon Corporation
- Shigeru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Feature extraction element, feature extraction system, and determin...
- Patent number 10,904,471
- Issue date Jan 26, 2021
- Nikon Corporation
- Shigeru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Exposure method and apparatus, and device production method
- Patent number 8,111,378
- Issue date Feb 7, 2012
- Nikon Corporation
- Kiyoshi Uchikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric position-measuring devices and methods
- Patent number 7,876,452
- Issue date Jan 25, 2011
- Nikon Corporation
- Michael R. Sogard
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle-beam microlithography masks and methods for manufa...
- Patent number 6,485,870
- Issue date Nov 26, 2002
- Nikon Corporation
- Kiyoshi Uchikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical recording method and reproducing method and recording appar...
- Patent number 5,636,195
- Issue date Jun 3, 1997
- Nikon Corporation
- Seishiro Saikan
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical measuring apparatus for measuring physichemical properties
- Patent number 5,589,936
- Issue date Dec 31, 1996
- Nikon Corporation
- Kiyoshi Uchikawa
- G02 - OPTICS
Information Patent Grant
Optical recording and/or reproducing apparatus and method utilizing...
- Patent number 5,568,460
- Issue date Oct 22, 1996
- Nikon Corporation
- Seishiro Saikan
- G11 - INFORMATION STORAGE
Information Patent Grant
Dispersed iridium based complementary electrochromic device
- Patent number 4,652,090
- Issue date Mar 24, 1987
- Nippon Kogaku K.K.
- Kiyoshi Uchikawa
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ELEMENT, SYSTEM HAVING THE ELEMENT, AND JUDGING APPARATUS
- Publication number 20230411428
- Publication date Dec 21, 2023
- Nikon Corporation
- Shigeru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELEMENT, SYSTEM HAVING THE ELEMENT, AND JUDGING APPARATUS
- Publication number 20210105426
- Publication date Apr 8, 2021
- Nikon Corporation
- Shigeru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FEATURE EXTRACTION ELEMENT, FEATURE EXTRACTION SYSTEM, AND DETERMIN...
- Publication number 20190034748
- Publication date Jan 31, 2019
- Nikon Corporation
- Shigeru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFEROMETRIC POSITION-MEASURING DEVICES AND METHODS
- Publication number 20080291464
- Publication date Nov 27, 2008
- NIKON CORPORATION
- Michael R. Sogard
- G01 - MEASURING TESTING
Information Patent Application
Exposure Method And Apparatus, And Device Production Method
- Publication number 20080246933
- Publication date Oct 9, 2008
- Nikon Corporation
- Kiyoshi Uchikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Exposure method and exposure apparatus, and device manufacturing me...
- Publication number 20080204682
- Publication date Aug 28, 2008
- Nikon Corporation
- Yusaku Uehara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Kiyoshi Uchikawa

Person

Patents Grantslast 30 patents

Element, system having the element, and judging apparatus

Feature extraction element, feature extraction system, and determin...

Exposure method and apparatus, and device production method

Interferometric position-measuring devices and methods

Charged-particle-beam microlithography masks and methods for manufa...

Optical recording method and reproducing method and recording appar...

Optical measuring apparatus for measuring physichemical properties

Optical recording and/or reproducing apparatus and method utilizing...

Dispersed iridium based complementary electrochromic device

Patents Applicationslast 30 patents

ELEMENT, SYSTEM HAVING THE ELEMENT, AND JUDGING APPARATUS

ELEMENT, SYSTEM HAVING THE ELEMENT, AND JUDGING APPARATUS

FEATURE EXTRACTION ELEMENT, FEATURE EXTRACTION SYSTEM, AND DETERMIN...

INTERFEROMETRIC POSITION-MEASURING DEVICES AND METHODS

Exposure Method And Apparatus, And Device Production Method

Exposure method and exposure apparatus, and device manufacturing me...