Kiyoshi Yagita

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspecting apparatus and method for foreign matter
- Patent number 7,342,655
- Issue date Mar 11, 2008
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus for foreign matter and inspecting mechanism th...
- Patent number 6,914,672
- Issue date Jul 5, 2005
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and apparatus for foreign matter
- Patent number 6,911,653
- Issue date Jun 28, 2005
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus for foreign matter
- Patent number 6,825,925
- Issue date Nov 30, 2004
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Integrated soft bag inspection system
- Patent number 6,504,606
- Issue date Jan 7, 2003
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Grant
Code recognition method and system for rotating body
- Patent number 6,089,455
- Issue date Jul 18, 2000
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign matter detecting system
- Patent number 6,081,324
- Issue date Jun 27, 2000
- Scan Technology Co., Ltd.
- Kiyoshi Yagita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspecting apparatus and method for foreign matter
- Publication number 20060244959
- Publication date Nov 2, 2006
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Inspecting apparatus for foreign matter
- Publication number 20030214649
- Publication date Nov 20, 2003
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Inspecting apparatus for foreign matter and inspecting mechanism th...
- Publication number 20030210397
- Publication date Nov 13, 2003
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Inspecting method and apparatus for foreign matter
- Publication number 20030201384
- Publication date Oct 30, 2003
- SCAN TECHNOLOGY CO., LTD.
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Impurities inspection system
- Publication number 20020063215
- Publication date May 30, 2002
- Kiyoshi Yagita
- G01 - MEASURING TESTING
Information Patent Application
Integrated soft bag inspection system
- Publication number 20020039183
- Publication date Apr 4, 2002
- Kiyoshi Yagita
- G01 - MEASURING TESTING