TREA

Kiyoshi Yamazaki

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Photomask inspecting method
    • Patent number 6,846,597
    • Issue date Jan 25, 2005
    • Dai Nippon Printing Co., Ltd.
    • Syogo Narukawa
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Substrate selector
    • Patent number 6,801,824
    • Issue date Oct 5, 2004
    • Dainippon Printing Co., Ltd.
    • Kouji Ishida
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

  • Information Patent Application

    Photomask inspecting method
    • Publication number 20030073010
    • Publication date Apr 17, 2003
    • DAI NIPPON PRINT. CO., LTD.
    • Syogo Narukawa
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Substrate selector
    • Publication number 20020173870
    • Publication date Nov 21, 2002
    • Kouji Ishida
    • G05 - CONTROLLING REGULATING