Kiyotaka HORIE

Person

Kamisato-machi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting surface of a disk
- Patent number 8,873,031
- Issue date Oct 28, 2014
- Hitachi High-Technologies Corporation
- Yu Yanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a surface of a substrate
- Patent number 8,547,545
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...
- Publication number 20140071442
- Publication date Mar 13, 2014
- Hitachi High-Technologies Corporation
- Shigeru SERIKAWA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTING APPARATUS HAVING DOUBLE RECIPE PROCESSING FUNCTION
- Publication number 20140043603
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Yu YANAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SURFACE OF A DISK
- Publication number 20130258326
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Kiyotaka HORIE
- G01 - MEASURING TESTING
Information Patent Application
DISK SURFACE INSPECTION METHOD AND DISK SURFACE INSPECTION DEVICE
- Publication number 20130258328
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Nobuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE SURFACE DEFECT INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20130077092
- Publication date Mar 28, 2013
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20120320367
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Yu Yanaka
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20120287426
- Publication date Nov 15, 2012
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE
- Publication number 20120081701
- Publication date Apr 5, 2012
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE INSPECTION INSTRUMENT AND PATTERN SHAPE INSPECTION ME...
- Publication number 20110272096
- Publication date Nov 10, 2011
- Hitachi High-Technologies Corporation
- Shigeru SERIKAWA
- G01 - MEASURING TESTING

Kiyotaka HORIE

Person

Patents Grantslast 30 patents

Method and apparatus for inspecting surface of a disk

Method and apparatus for inspecting a surface of a substrate

Patents Applicationslast 30 patents

OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...

SURFACE INSPECTING APPARATUS HAVING DOUBLE RECIPE PROCESSING FUNCTION

METHOD AND APPARATUS FOR INSPECTING SURFACE OF A DISK

DISK SURFACE INSPECTION METHOD AND DISK SURFACE INSPECTION DEVICE

SUBSTRATE SURFACE DEFECT INSPECTION METHOD AND INSPECTION DEVICE

INSPECTION METHOD AND DEVICE FOR SAME

PATTERN INSPECTION METHOD AND DEVICE FOR SAME

METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE

PATTERN SHAPE INSPECTION INSTRUMENT AND PATTERN SHAPE INSPECTION ME...