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Kiyoto NAKAMURA

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Patents Grantslast 30 patents

  • Information Patent Grant

    Test carrier
    • Patent number 9,702,901
    • Issue date Jul 11, 2017
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test carrier
    • Patent number 9,645,173
    • Issue date May 9, 2017
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket and electronic device test apparatus
    • Patent number 9,250,263
    • Issue date Feb 2, 2016
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test carrier
    • Patent number 9,030,223
    • Issue date May 12, 2015
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test carrier
    • Patent number 8,994,394
    • Issue date Mar 31, 2015
    • Advantest Corporation
    • Yoshinari Kogure
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket and electronic device test apparatus
    • Patent number 8,988,095
    • Issue date Mar 24, 2015
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test carrier and board assembly
    • Patent number 8,970,243
    • Issue date Mar 3, 2015
    • Advantest Corporation
    • Yoshinari Kogure
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test carrier
    • Patent number 8,952,383
    • Issue date Feb 10, 2015
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test carrier
    • Patent number 8,850,907
    • Issue date Oct 7, 2014
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact device and method for producing the same
    • Patent number 7,800,386
    • Issue date Sep 21, 2010
    • Advantest Corporation
    • Kiyoto Nakamura
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Structure of ohmic electrode for semiconductor by atomic layer doping
    • Patent number 5,793,109
    • Issue date Aug 11, 1998
    • Advantest Corp.
    • Kiyoto Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    BIOSENSOR
    • Publication number 20230257693
    • Publication date Aug 17, 2023
    • Advantest Corporation
    • Kiyoto NAKAMURA
    • C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
  • Information Patent Application

    BIOSENSOR, CHANNEL MEMBER USED IN BIOSENSOR, AND METHOD OF USING BI...
    • Publication number 20220333150
    • Publication date Oct 20, 2022
    • Advantest Corporation
    • Kiyoto Nakamura
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    TEST CARRIER
    • Publication number 20150168448
    • Publication date Jun 18, 2015
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOCKET AND ELECTRONIC DEVICE TEST APPARATUS
    • Publication number 20150153388
    • Publication date Jun 4, 2015
    • Advantest Corporation
    • Kiyoto NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOCKET AND ELECTRONIC DEVICE TEST APPARATUS
    • Publication number 20150153389
    • Publication date Jun 4, 2015
    • Advantest Corporation
    • Kiyoto NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER
    • Publication number 20150130492
    • Publication date May 14, 2015
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER
    • Publication number 20150130494
    • Publication date May 14, 2015
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER, DEFECT DETERMINATION APPARATUS, AND DEFECT DETERMINAT...
    • Publication number 20150061717
    • Publication date Mar 5, 2015
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOCKET AND ELECTRONIC DEVICE TEST APPARATUS
    • Publication number 20130214809
    • Publication date Aug 22, 2013
    • Kiyoto NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER
    • Publication number 20130120014
    • Publication date May 16, 2013
    • Kiyoto NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER AND METHOD OF ASSEMBLY OF TEST CARRIER
    • Publication number 20130120013
    • Publication date May 16, 2013
    • Takashi FUJISAKI
    • B32 - LAYERED PRODUCTS
  • Information Patent Application

    TEST CARRIER
    • Publication number 20130120015
    • Publication date May 16, 2013
    • Kiyoto NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER
    • Publication number 20130082259
    • Publication date Apr 4, 2013
    • Kiyoto NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER
    • Publication number 20120235699
    • Publication date Sep 20, 2012
    • Advantest Corporation
    • Kiyoto Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST CARRIER
    • Publication number 20110271774
    • Publication date Nov 10, 2011
    • Advantest Corporation
    • Kiyoto NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    DELAY LINE, SIGNAL DELAY METHOD, AND TEST SIGNAL GENERATING APPARATUS
    • Publication number 20090195328
    • Publication date Aug 6, 2009
    • Advantest Corporation
    • Kiyoto NAKAMURA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    CONTACT DEVICE AND METHOD FOR PRODUCING THE SAME
    • Publication number 20090184728
    • Publication date Jul 23, 2009
    • Advantest Corporation
    • Kiyoto Nakamura
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    HIGH FREQUENCY CIRCUIT APPARATUS
    • Publication number 20080061922
    • Publication date Mar 13, 2008
    • Advantest Corporation
    • KIYOTO NAKAMURA
    • B81 - MICRO-STRUCTURAL TECHNOLOGY