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Kiyotoshi Miura

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  • Hirakawa-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20100134121
    • Publication date Jun 3, 2010
    • KABUSHIKI KAISHA NIHON MICRONICS
    • Hitoshi Sato
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20100066396
    • Publication date Mar 18, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20090212800
    • Publication date Aug 27, 2009
    • Kabushiki Kaisha Nihon Micronics
    • Hidehiro KIYOFUJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRIC CONNECTING APPARATUS
    • Publication number 20090160469
    • Publication date Jun 25, 2009
    • Kabushiki Kaisha Nihon Micronics
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...
    • Publication number 20090058440
    • Publication date Mar 5, 2009
    • Kabushiki Kaisha Nihon Micronics
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electrical Connecting Apparatus
    • Publication number 20080315905
    • Publication date Dec 25, 2008
    • Kabushiki Kaisha Nihon Mocronics
    • Shinji Kuniyoshi
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR TEST APPARATUS
    • Publication number 20080297184
    • Publication date Dec 4, 2008
    • Kabushiki Kaisha Nihon Micronics
    • Kiyotoshi MIURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20080197869
    • Publication date Aug 21, 2008
    • Kabushiki Kaisha Nihon Micronics
    • Yuji MIYAGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20080122467
    • Publication date May 29, 2008
    • Kabushiki Kaisha Nihon Micronics
    • Yuji MIYAGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe For Electric Test
    • Publication number 20070216433
    • Publication date Sep 20, 2007
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING