Kiyoyasu HIWADA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Secondary battery
- Patent number 10,347,893
- Issue date Jul 9, 2019
- Kabushiki Kaisha Nihon Micronics
- Takuo Kudoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary battery-mounted circuit chip and manufacturing method the...
- Patent number 10,090,507
- Issue date Oct 2, 2018
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki Tsunokuni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation apparatus and evaluation method of sheet type cell
- Patent number 10,036,780
- Issue date Jul 31, 2018
- Kabushiki Kaisha Nihon Micronics
- Harutada Dewa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary battery
- Patent number 9,972,862
- Issue date May 15, 2018
- Kabushiki Kaisha Nihon Micronics
- Takuo Kudoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode structure of solid type secondary battery
- Patent number 9,865,908
- Issue date Jan 9, 2018
- Kabushiki Kaisha Nihon Micronics
- Takuo Kudoh
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Repair apparatus of sheet type cell
- Patent number 9,799,927
- Issue date Oct 24, 2017
- Kabushiki Kaisha Nihon Micronics
- Kiyoyasu Hiwada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor probe, testing device and testing method for testing...
- Patent number 9,778,284
- Issue date Oct 3, 2017
- Kabushiki Kaisha Nihon Micronics
- Harutada Dewa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single layer secondary battery having a folded structure
- Patent number 9,748,596
- Issue date Aug 29, 2017
- Kabushiki Kaisha Nihon Micronics
- Takuo Kudoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charging/discharging device
- Patent number 9,735,594
- Issue date Aug 15, 2017
- Kabushiki Kaisha Nihon Micronics
- Harutada Dewa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Testing device and testing method for quantum battery using semicon...
- Patent number 9,164,149
- Issue date Oct 20, 2015
- Kabushiki Kaisha Nihon Micronics
- Harutada Dewa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electrical connection structure
- Patent number 5,597,982
- Issue date Jan 28, 1997
- Hewlett-Packard Company
- Kiyoyasu Hiwada
- G01 - MEASURING TESTING
Information Patent Grant
High speed data train generating system with no restriction on leng...
- Patent number 5,404,564
- Issue date Apr 4, 1995
- Hewlett-Packard Company
- Kiyoyasu Hiwada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for generating test waveforms to be applied to...
- Patent number 5,293,080
- Issue date Mar 8, 1994
- Hewlett-Packard Company
- Kiyoyasu Hiwada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing electronic devices
- Patent number 5,289,116
- Issue date Feb 22, 1994
- Hewlett-Packard Company
- Jun Kurita
- G01 - MEASURING TESTING
Information Patent Grant
Test head with improved shielding
- Patent number 5,051,689
- Issue date Sep 24, 1991
- Hewlett-Packard Company
- Kiyoyasu Hiwada
- G01 - MEASURING TESTING
Information Patent Grant
Test head with improved shielding
- Patent number 4,975,639
- Issue date Dec 4, 1990
- Hewlett-Packard Company
- Kiyoyasu Hiwada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring settling characteristics of a de...
- Patent number 4,833,403
- Issue date May 23, 1989
- Hewlett-Packard Company
- Toshio Tamamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING DEVICE AND TESTING METHOD FOR SHEET-SHAPED CELL
- Publication number 20170131361
- Publication date May 11, 2017
- Kabushiki Kaisha Nihon Micronics
- Tomokazu SAITO
- G01 - MEASURING TESTING
Information Patent Application
BATTERY
- Publication number 20170098870
- Publication date Apr 6, 2017
- Kabushiki Kaisha Nihon Micronics
- Juri OGASAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY BATTERY-MOUNTED CIRCUIT CHIP AND MANUFACTURING METHOD THE...
- Publication number 20160181588
- Publication date Jun 23, 2016
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki TSUNOKUNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROBE, TESTING DEVICE AND TESTING METHOD FOR TESTING...
- Publication number 20150192611
- Publication date Jul 9, 2015
- GUALA TECHNOLOGY CO., LTD.
- Harutada Dewa
- G01 - MEASURING TESTING
Information Patent Application
CHARGING/DISCHARGING DEVICE
- Publication number 20150188337
- Publication date Jul 2, 2015
- Harutada Dewa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SECONDARY BATTERY
- Publication number 20150188113
- Publication date Jul 2, 2015
- Kabushiki Kaisha Nihon Micronics
- Takuo Kudoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRODE STRUCTURE OF SOLID TYPE SECONDARY BATTERY
- Publication number 20150155608
- Publication date Jun 4, 2015
- GUALA TECHNOLOGY CO., LTD.
- Takuo Kudoh
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SECONDARY BATTERY
- Publication number 20150111108
- Publication date Apr 23, 2015
- Kabushiki Kaisha Nihon Micronics
- Takuo Kudoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY BATTERY
- Publication number 20150072231
- Publication date Mar 12, 2015
- Kabushiki Kaisha Nihon Micronics
- Takuo Kudoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPAIR APPARATUS OF SHEET TYPE CELL
- Publication number 20150000119
- Publication date Jan 1, 2015
- Kabushiki Kaisha Nihon Micronics
- Kiyoyasu Hiwada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD OF SHEET TYPE CELL
- Publication number 20140327445
- Publication date Nov 6, 2014
- Kabushiki Kaisha Nihon Micronics
- Harutada Dewa
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD FOR QUANTUM BATTERY USING SEMICON...
- Publication number 20140320108
- Publication date Oct 30, 2014
- GUALA TECHNOLOGY CO., LTD.
- Harutada Dewa
- B82 - NANO-TECHNOLOGY

Kiyoyasu HIWADA

Person

Patents Grantslast 30 patents

Secondary battery

Secondary battery-mounted circuit chip and manufacturing method the...

Evaluation apparatus and evaluation method of sheet type cell

Secondary battery

Electrode structure of solid type secondary battery

Repair apparatus of sheet type cell

Semiconductor probe, testing device and testing method for testing...

Single layer secondary battery having a folded structure

Charging/discharging device

Testing device and testing method for quantum battery using semicon...

Electrical connection structure

High speed data train generating system with no restriction on leng...

Method and apparatus for generating test waveforms to be applied to...

Apparatus and method for testing electronic devices

Test head with improved shielding

Test head with improved shielding

Method and apparatus for measuring settling characteristics of a de...

Patents Applicationslast 30 patents

TESTING DEVICE AND TESTING METHOD FOR SHEET-SHAPED CELL

BATTERY

SECONDARY BATTERY-MOUNTED CIRCUIT CHIP AND MANUFACTURING METHOD THE...

SEMICONDUCTOR PROBE, TESTING DEVICE AND TESTING METHOD FOR TESTING...

CHARGING/DISCHARGING DEVICE

SECONDARY BATTERY

ELECTRODE STRUCTURE OF SOLID TYPE SECONDARY BATTERY

SECONDARY BATTERY

SECONDARY BATTERY

REPAIR APPARATUS OF SHEET TYPE CELL

EVALUATION APPARATUS AND EVALUATION METHOD OF SHEET TYPE CELL

TESTING DEVICE AND TESTING METHOD FOR QUANTUM BATTERY USING SEMICON...