Klaas Akkermann

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Rosenheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for removing tested semiconductor components
- Patent number 9,014,841
- Issue date Apr 21, 2015
- Multitest Elektronishche Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR REMOVING TESTED SEMICONDUCTOR COMPONENTS
- Publication number 20130338818
- Publication date Dec 19, 2013
- Thomas Hofmann
- G01 - MEASURING TESTING