Klaus D. Hilliges

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for processing automatically generated test pat...
- Patent number 7,386,777
- Issue date Jun 10, 2008
- Verigy (Singapore) Pte. Ltd.
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of allocating device testing resources to sites...
- Patent number 7,279,919
- Issue date Oct 9, 2007
- Verigy (Singapore) Pte. Ltd.
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing circuitry using an externally generat...
- Patent number 7,131,046
- Issue date Oct 31, 2006
- Verigy IPco
- Erik H. Volkerink
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Allocating device testing resources
- Publication number 20060158203
- Publication date Jul 20, 2006
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for processing automatically generated test pat...
- Publication number 20050229062
- Publication date Oct 13, 2005
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Application
System and method for testing circuitry using an externally generat...
- Publication number 20040107395
- Publication date Jun 3, 2004
- Erik H. Volkerink
- G01 - MEASURING TESTING