Klaus-Dieter Anders

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Wurenlos, CH

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Patents Grantslast 30 patents

Information Patent Grant
Sampling device
- Patent number 8,701,509
- Issue date Apr 22, 2014
- Mettler-Toledo AG
- Klaus-Dieter Anders
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device, measuring probe, and method of operating the meas...
- Patent number 7,924,017
- Issue date Apr 12, 2011
- Mettler-Toledo AG
- Jürgen Ammann
- G01 - MEASURING TESTING
Information Patent Grant
Attenuated total reflection sensor
- Patent number 7,755,763
- Issue date Jul 13, 2010
- Mettler-Toledo AG
- Klaus-Dieter Anders
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the condition of a measuring probe
- Patent number 7,290,434
- Issue date Nov 6, 2007
- Mettler-Toledo AG
- Jürgen Ammann
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor for determining an analyte, and method of manufactur...
- Patent number 6,653,148
- Issue date Nov 25, 2003
- Mettler-Toledo GmbH
- Thilo Trapp
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLING DEVICE
- Publication number 20110252898
- Publication date Oct 20, 2011
- METTLER-TOLEDO AG
- Klaus-Dieter Anders
- G01 - MEASURING TESTING
Information Patent Application
ATTENUATED TOTAL REFLECTION SENSOR
- Publication number 20080309922
- Publication date Dec 18, 2008
- METTLER-TOLEDO AG
- Klaus-Dieter Anders
- G01 - MEASURING TESTING
Information Patent Application
Measuring device, measuring probe, and method of operating the meas...
- Publication number 20070214872
- Publication date Sep 20, 2007
- METTLER-TOLEDO AG
- Jurgen Ammann
- G01 - MEASURING TESTING
Information Patent Application
Method and device for determining the condition of a measuring probe
- Publication number 20050166660
- Publication date Aug 4, 2005
- Mettler-Toledo GmbH
- Jurgen Ammann
- G01 - MEASURING TESTING
Information Patent Application
Optical sensor for determining an analyte, and method of manufactur...
- Publication number 20030017078
- Publication date Jan 23, 2003
- Thilo Trapp
- G01 - MEASURING TESTING