Klaus-Dieter Hilliges

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
System, methods and apparatus using virtual appliances in a semicon...
- Patent number 10,025,648
- Issue date Jul 17, 2018
- Advantest Corporation
- Klaus-Dieter Hilliges
- G05 - CONTROLLING REGULATING
Information Patent Grant
System, methods and apparatus using virtual appliances in a semicon...
- Patent number 9,317,351
- Issue date Apr 19, 2016
- Advantest Corporation
- Klaus-Dieter Hilliges
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic information capture from logic devices with built-in sel...
- Patent number 7,797,599
- Issue date Sep 14, 2010
- Verigy (Singapore) Pte. Ltd.
- Ajay Khoche
- G01 - MEASURING TESTING
Information Patent Grant
ATE architecture and method for DFT oriented testing
- Patent number 7,712,000
- Issue date May 4, 2010
- Verigy (Singapore) Pte. Ltd.
- Ajay Khoche
- G01 - MEASURING TESTING
Information Patent Grant
Re-configurable architecture for automated test equipment
- Patent number 7,590,903
- Issue date Sep 15, 2009
- Verigy (Singapore) Pte. Ltd.
- Erik Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Parametric measurement of high-speed I/O systems
- Patent number 7,571,363
- Issue date Aug 4, 2009
- Agilent Technologies, Inc.
- Hugh S. Wallace
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System, Methods and Apparatus Using Virtual Appliances in a Semicon...
- Publication number 20150370248
- Publication date Dec 24, 2015
- Advantest Corporation
- Klaus-Dieter Hilliges
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM, METHODS AND APPARATUS USING VIRTUAL APPLIANCES IN A SEMICON...
- Publication number 20140189430
- Publication date Jul 3, 2014
- Verigy (Singapore) Pte. Ltd.
- Klaus-Dieter Hilliges
- G01 - MEASURING TESTING
Information Patent Application
ATE architecture and method for DFT oriented testing
- Publication number 20080104461
- Publication date May 1, 2008
- Ajay Khoche
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Information Capture from Logic Devices with Built-in Sel...
- Publication number 20080092003
- Publication date Apr 17, 2008
- Ajay Khoche
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Information Capture from Memory Devices with Built-in Se...
- Publication number 20080077836
- Publication date Mar 27, 2008
- A. Jay Khoche
- G01 - MEASURING TESTING
Information Patent Application
Deterministic Diagnostic Information Capture from Memory Devices wi...
- Publication number 20080077834
- Publication date Mar 27, 2008
- Ajay Khoche
- G11 - INFORMATION STORAGE
Information Patent Application
Automatic Test Equipment Receiving Diagnostic Information from Devi...
- Publication number 20080077835
- Publication date Mar 27, 2008
- A. Jay Khoche
- G01 - MEASURING TESTING
Information Patent Application
Parametric Measurement of High-Speed I/O Systems
- Publication number 20070268963
- Publication date Nov 22, 2007
- Hugh S. Wallace
- G01 - MEASURING TESTING
Information Patent Application
Re-configurable architecture for automated test equipment
- Publication number 20070266288
- Publication date Nov 15, 2007
- Erik Volkerink
- G01 - MEASURING TESTING

Klaus-Dieter Hilliges

Person

Patents Grantslast 30 patents

System, methods and apparatus using virtual appliances in a semicon...

System, methods and apparatus using virtual appliances in a semicon...

Diagnostic information capture from logic devices with built-in sel...

ATE architecture and method for DFT oriented testing

Re-configurable architecture for automated test equipment

Parametric measurement of high-speed I/O systems

Patents Applicationslast 30 patents

System, Methods and Apparatus Using Virtual Appliances in a Semicon...

SYSTEM, METHODS AND APPARATUS USING VIRTUAL APPLIANCES IN A SEMICON...

ATE architecture and method for DFT oriented testing

Diagnostic Information Capture from Logic Devices with Built-in Sel...

Diagnostic Information Capture from Memory Devices with Built-in Se...

Deterministic Diagnostic Information Capture from Memory Devices wi...

Automatic Test Equipment Receiving Diagnostic Information from Devi...

Parametric Measurement of High-Speed I/O Systems

Re-configurable architecture for automated test equipment